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High Throughput Rate Solid State Detector Systems for Fluorescence EXAFS

Published online by Cambridge University Press:  06 March 2019

G. E. Derbyshire ,
R. C. Farrow ,
R. L. Bilsborrow ,
C. Morrell ,
G. N. Greaves  and
B. R. Dobson
G. E. Derbyshire
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
R. C. Farrow
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
R. L. Bilsborrow
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
C. Morrell
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
G. N. Greaves
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
B. R. Dobson
Affiliation:
SERC Daresbury Laboratory, Warrington WA4 4AD, UK
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Abstract

Existing Solid State Detector systems exhibit limitations in throughput rate and stability when used with intense synchrotron radiation sources. Recent work on a prototype detector system for Fluorescence EXAFS has allowed evaluation of new techniques, made possible by recent improvements in integrated circuit products. The knowledge gained from this investigation is enabling the design of high-count rate detector systems.

Type
V. XRF Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 187 - 191
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Cramer, S. P., Kraner, H., Rogers, L., Yocum, M., Colaresi, J. and Tench, O., 1990, XAFS 6 Conference Proceedings (in press).Google Scholar