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High-Temperature Displacement Measurement Using a Scanning Focused X-ray Line Source

Published online by Cambridge University Press:  06 March 2019

E. H. Jordan ,
H. A. Canistraro ,
D. M. Pease  and
D. Brewe
E. H. Jordan
Affiliation:
Mechanical Engineering Department University of Connecticut Storrs, CT 06268
H. A. Canistraro
Affiliation:
Mechanical Engineering Department University of Connecticut Storrs, CT 06268
D. M. Pease
Affiliation:
Physics and Institute of Materials Science University of Connecticut Storrs, CT 06268
D. Brewe
Affiliation:
Physics and Institute of Materials Science University of Connecticut Storrs, CT 06268
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Abstract

A non-contacting displacement measuring system utilizing focussed x-rays is being developed for use in hostile environments. Ultimately, this method will be used to measure mechnical strain under adverse conditions such as high temperatures, flame, cutting fluids, and gases with high velocity and pressure gradients. The foundation of the technique is the use of xrays, which are immune to the various environmental factors mentioned above. The proposed system uses a highly focussed, intense x-ray line which is scanned across markers that fluoresce secondary radiation. This secondary radiation level is then monitored using a photon detector and marker-focussed line overlap can be discerned. These targets can be used as fiducial markers demarcating a gage length, and the change in pointing angle of the focussed beam at target overlap is used as a measure of relative displacement. The present experimental systemcan consistently resolve 1.27 microns at ambient conditions, and 2.54 microns have been measured at a target temperature of 1900 de-grees F through an open flame. Given the performance of the current apparatus, equipment improvements should permit increases in resolution by a least a factor of 10 and measurements at much higher temperatures are possible.

Type
V. XRF Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 223 - 230
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

1. Hudson, L. D., “Proceedings of the Sixth Annual Hostile Environments and High Temperature Strain Measurements Conference”, Society for Experimental Mechanics, pp 68-81 (November 1989).Google Scholar
2. Broek, D., “Elementary Engineering Fracture Mechanics 4th Edition”, Martinus Nijhoff, 1986.Google Scholar