Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-27T12:39:53.885Z Has data issue: false hasContentIssue false
  • English
  • Français

Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer

Published online by Cambridge University Press:  06 March 2019

J. B. Cross  and
L. V. Wilson
J. B. Cross
Affiliation:
Phillips Petroleum Company, Bartlesville, OK 74004
L. V. Wilson
Affiliation:
Phillips Petroleum Company, Bartlesville, OK 74004
Get access

Extract

X-ray spectrometry has been used successfully for major and trace element analysis of geological samples (e.g. reference 1). Its advantage is providing accurate and precise results in a rapid manner: a key factor in selecting analytical methods for mineralogical studies involving large numbers of samples. All elements with atomic numbers greater than 9 (fluorine), except noble gases, can be determined with sensitivities ranging down to ppm levels.

The analytical method described in this report is for the determination of the major elements (i.e. Na, Mg, Al, Si, P, K, Ca, Ti, Mn and Fe) in geological samples. Commercially available automated fusion devices are used for sample preparation.

Type
VIII. XRF General Applications
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 451 - 456
Copyright
Copyright © International Centre for Diffraction Data 1982

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Hutton, J. T. and Elliott, S. M., Chemical Geology, 29:1–11 (1980).Google Scholar
2. Abbey, S., Geological Survey of Canada, Paper 80-14, Part 6 . 1979 Edition of “Usable” Values, (1980).Google Scholar
3. Plesch, R., Siemens X-Ray Analytical Application Note No. 28, Siemens Corp.Google Scholar