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Feasibility of the X-Ray Spectrograph as a Continuous Analytical Instrument for Process Control

Published online by Cambridge University Press:  06 March 2019

Robert A. McCune ,
William M. Mueller  and
Pauline J. Dunton
Robert A. McCune
Affiliation:
Denver Research Institute, Denver, Colorado
William M. Mueller
Affiliation:
Denver Research Institute, Denver, Colorado
Pauline J. Dunton
Affiliation:
Denver Research Institute, Denver, Colorado
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Abstract

Studies have been made of the application of X-ray spectrography to continuous analysis for process control. To date the most widespread application of fluorescent X-ray spectrography to process control has been in measurement of plating thickness. Realizing that many other processes could use a method of continuous analysis of moving materials, these studies were undertaken.

A modified tube housing and sample holder was constructed so that material could be passed through the X-ray beam, of a conventional X-ray spectrograph at various linear speeds. Detectability versus material speeds were studied for a number of elements in various mediums.

Application of fluorescent X-ray spectrography as a continuous analytical tool looks very promising. Further studies on specific plant problems should provide useful and advantageous industrial applications of the basic information developed here.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 1: Sixth Annual Conference on Industrial Applications of X-ray Analysis, August 7-9, 1957 , 1957 , pp. 399 - 407
Copyright
Copyright © International Centre for Diffraction Data 1957

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