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A Focusing System for X-ray Diffraction Studies of Materials Under High Pressure in the Diamond Cell

Published online by Cambridge University Press:  06 March 2019

Y. Wu ,
A. C. Thompson ,
J. H. Underwood ,
H. K. Mao ,
Y. W. Fei ,
J. Z. Hu ,
J. V. Badding  and
J. F. Shu
Y. Wu
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
A. C. Thompson
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
J. H. Underwood
Affiliation:
Lawrence Berkeley Laboratory Berkeley, CA 94720
H. K. Mao
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
Y. W. Fei
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. Z. Hu
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. V. Badding
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
J. F. Shu
Affiliation:
Geophysical Laboratory 5251 Broad Branch Road, NW Washington DC, 20015
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Extract

Recent advances in techniques to generate static ultra-high pressure (>100 GPa) in the diamond anvil cell have significantly enhanced our understanding of the properties of solids under these extreme conditions. In order to characterize the structure of solids at these pressures, X-ray diffraction using synchrotron radiation has become an invaluable tool. Since the highest pressures are attained at the expense of sample volume (~ 100 μm3) , it is best to use the intense radiation available from a synchrotron to study the very small samples used in ultra-high pressure studies. Even with the intense x-ray beams currently available, it is still often desirable to focus the x-ray beam to increase the available flux. We have developed a focusing system which uses multilayer coated spherical mirrors. With this system, intense x-ray beams with sizes smaller than 10 μm by 10 μm can be achieved at a synchrotron radiation beamline. Previously, we used the focusing system for x-ray microprobe experiments.

Type
IX. Nonambient Application of Diffraction
Information
Advances in X-Ray Analysis , Volume 34: Thirty-Ninth Annual Conference on Applications of X-ray Analysis, July 30 - August 3, 1990 , 1990 , pp. 437 - 446
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

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