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A Rapid Direct X-Ray Fluorescence Method for Simultaneously Determining Brass Composition and Plating Weight for Brass-Plated-Steel Tire Cord Wires

Published online by Cambridge University Press:  06 March 2019

James Gianelos
James Gianelos*
Affiliation:
The B. F. Goodrich Company Research and Development Center, Brecksville, Ohio 44141
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Abstract

A rapid direct x-ray fluorescence (XRF) method has been developed for simultaneously determining brass composition and plating weight for brass -plated-steel tire cord wires. On a manual XRF instrument, a complete analysis can be done in ten minutes including calculations. A complete analysis can be done in only two or three minutes on a multi-channel Quantometer-type instrument. The method can easily be adapted to “on line” use.

Analysis is done directly on the “as received wires. Sample preparation is simple and non-critical with no surface pre-treatment of any kind required. Sample weighing and dissolution of the brass plating are entirely eliminated. Wire samples may be either stranded or unstranded. Rather large variations in sample size can be tolerated because of the ratio-type calculation system used. Analytical precision is high.

Calibration curves were established by wet chemical, atomic absorption, and solution-XRF methods. No serious calibration problems were encountered because the plating is an alloy, or because count data were taken from round, non-flat samples. Low impurity levels of iron in the brass plating are shown to have an insignificant effect on the plating weight calibration curve.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 17: Twenty-Second Annual Conference on Applications of X-ray Analysis, August 22-24, 1973 , 1973 , pp. 325 - 336
Copyright
Copyright © International Centre for Diffraction Data 1973

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References

1. Liebhafsky, H. A., Pfeiffer, H. G., Winslow, E. H., Zemany, P. D., “X-Rays, Electrons, and Analytical Chemistry,” John Wiley & Sons, Inc. (1972).Google Scholar
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3. Liebhafsky, H. A. and Zemany, P. D., “Film Thickness by X-Ray Emission Spectrography,” Analytical Chemistry 28 455–459 (1956).Google Scholar