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Wide Angle and Small Angle X-ray Scattering Applications Using a Two-Dimensional Area Detector

Published online by Cambridge University Press:  06 March 2019

B. G. Landes
Affiliation:
Analytical Sciences Laboratory, 1897 Building Dow Chemical U.S.A., Midland, MI 48667
R. A. Newman
Affiliation:
Analytical Sciences Laboratory, 1897 Building Dow Chemical U.S.A., Midland, MI 48667
P. R. Rudolf
Affiliation:
Analytical Sciences Laboratory, 1897 Building Dow Chemical U.S.A., Midland, MI 48667
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Extract

The traditional medium for collecting two-dimensional x-ray scattering patterns is photographic film. While x-ray film has excellent resolution, several factors make it a poor choice as a detection device: slow speed, limited dynamic range, the “human factor” (developing, fixing, film handling), and the lack of a commercial scanning system designed for reading two-dimensional x-ray films. Until recently, there were no practical alternatives to the use of photographic film for obtaining two-dimensional x-ray scattering data using a conventional x-ray source. In the past few years, two different detection systems have become available for collecting high quality two-dimensional x-ray scattering data: (1) the Siemens (Xentronics) area detector system, which is a gas filled, wire grid detector, and (2) the Fuji imaging-plate system, which utilizes a phosphor storage plate for imaging the x-ray scattering and a laser scanner to process the image.

Type
VII. Solid State and Position-Sensitive Detectors for XRD
Copyright
Copyright © International Centre for Diffraction Data 1990

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References

* Trademark of Precision Visuals, Inc.