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X-Ray Fluorescence Analysis Using Synchrotron Radiation

Published online by Cambridge University Press:  06 March 2019

J.V. Gilfrich ,
E.F. Skelton ,
D.J. Nagel ,
A.W. Webb ,
S.B. Qadri  and
J.P. Kirkland
J.V. Gilfrich
Affiliation:
Naval Research Laboratory, Washington, DC 20375
E.F. Skelton
Affiliation:
Naval Research Laboratory, Washington, DC 20375
D.J. Nagel
Affiliation:
Naval Research Laboratory, Washington, DC 20375
A.W. Webb
Affiliation:
Naval Research Laboratory, Washington, DC 20375
S.B. Qadri
Affiliation:
Sachs/Freeman Associates, Bowie, MD 20715
J.P. Kirkland
Affiliation:
Sachs/Freeman Associates, Bowie, MD 20715
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Extract

Synchrotron radiation (SR) has several unique properties which cause it to be used for many purposes in science and technology. It is continuous spectrally, collimated spatially, short-pulsed yet continuously-operating temporally, as well as polarized( 1). Many applications of SR have already been demonstrated. These range from production of fine scale structures by lithography to numerous studies of materials. Determination of atomic structure by diffraction and other scattering experiments and by absorption spectroscopy (EXAFS), and emission spectroscopic studies of electronic structure have been given most attention(2). Only limited attention has been paid to determination of materials composition by x-ray fluorescence analysis (XRF) employing synchrotron radiation. Sparks et al.(3-5) have performed the most notable experiments, examining mica inclusions for the presence of primordial super heavy elements and irradiating two National Bureau of Standards Standard Reference Materials (SRM 1571, Orchard Leaves and SRM 1632, Coal) to measure the fluorescent x—ray intensity from the trace elements.

Type
VI. New XRF Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 313 - 323
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

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