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A High Resolution Echelle Spectrometer for Soft X-ray and EUV Astronomy

Published online by Cambridge University Press:  12 April 2016

James Green  and
Stuart Bowyer
James Green
Affiliation:
Space Sciences Laboratory, University of California, Berkeley, CA, USA
Stuart Bowyer
Affiliation:
Space Sciences Laboratory, University of California, Berkeley, CA, USA

Abstract

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We present a new design for high resolution spectroscopy from 80 to 400 Å. This design employs grazing incidence optics and variable line-spaced gratings to achieve high resolution. Unlike some previously proposed EUV echelles, this design employs straight groove planar gratings, which are a well-proven, easily manufactured design. The instrument delivers a peak resolution of λ/Δλ = 7500 and a peak effective area of 3 cm2.

Type
9. Future X-ray Observatories, Detectors and Instrumentation
Information
International Astronomical Union Colloquium , Volume 115: High Resolution X-ray Spectroscopy of Cosmic Plasmas , 1990 , pp. 330 - 334
Copyright
Copyright © Cambridge University Press 1990

References

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