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Characterization of a loaded high impedance surface

Published online by Cambridge University Press:  07 January 2010

Fabrice Linot ,
Xavier Begaud ,
Michel Soiron ,
Christian Renard  and
Michèle Labeyrie
Fabrice Linot*
Affiliation:
Institut Telecom – Telecom ParisTech – LTCI – CNRS – UMR5141 – 46 Rue Barrault, 75634 Paris, France. THALES Aerospace Division, 78852 Elancourt Cedex, France.
Xavier Begaud*
Affiliation:
Institut Telecom – Telecom ParisTech – LTCI – CNRS – UMR5141 – 46 Rue Barrault, 75634 Paris, France.
Michel Soiron
Affiliation:
THALES Aerospace Division, 78852 Elancourt Cedex, France.
Christian Renard
Affiliation:
THALES Aerospace Division, 78852 Elancourt Cedex, France.
Michèle Labeyrie
Affiliation:
THALES Aerospace Division, 78852 Elancourt Cedex, France.
*
Corresponding author: F. Linot and X. Begaud Emails: Fabrice.Linot@telecom-paristech.fr, Xavier.Begaud@telecom-paristech.fr
Corresponding author: F. Linot and X. Begaud Emails: Fabrice.Linot@telecom-paristech.fr, Xavier.Begaud@telecom-paristech.fr
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Abstract

A high impedance surface (HIS) consisting of metallic square patches electrically connected one to each other with resistors is shown. Tunability of the absorption factor is achieved by the resistor value. The absorbing band of the loaded HIS is determined by the phase of the signal reflected by this structure. The main contribution of the paper is to demonstrate the absorption behavior over a wide range of incidence angle for both Transverse Electric (TE) and Transverse Magnetic (TM) polarizations. Using an equivalent circuit the resistor effect is investigated. It is shown that at resonance, the judicious choice of the resistor may lead to a significant absorption. The use of a waveguide simulator to characterize the performance of the loaded HIS is investigated. These methods have been used to design an ultra-thin absorber about λ8.4 GHz/35 thick.

Keywords

High impedance surface (HIS)Ultra-thin radar absorbing materialSalisbury screenResistorWaveguide simulator
Type
Original Article
Information
International Journal of Microwave and Wireless Technologies , Volume 1 , Special Issue 6: 2009 National Microwave Days in France , December 2009 , pp. 483 - 487
Copyright
Copyright © Cambridge University Press and the European Microwave Association 2010

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References

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