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Morphology of heavily B-doped diamond films

Published online by Cambridge University Press:  03 March 2011

Koichi Miyata
Affiliation:
Kobe Steel, Ltd., Electronics Research Laboratory, 5-5, Takatsuka-dai 1-chome, Nishi-ku, Kobe 651-22, Japan
Kazuo Kumagai
Affiliation:
Kobe Steel, Ltd., Electronics Research Laboratory, 5-5, Takatsuka-dai 1-chome, Nishi-ku, Kobe 651-22, Japan
Kozo Nishimura
Affiliation:
Kobe Steel, Ltd., Electronics Research Laboratory, 5-5, Takatsuka-dai 1-chome, Nishi-ku, Kobe 651-22, Japan
Koji Kobashi
Affiliation:
Kobe Steel, Ltd., Electronics Research Laboratory, 5-5, Takatsuka-dai 1-chome, Nishi-ku, Kobe 651-22, Japan
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Abstract

B-doped diamond films were synthesized by microwave plasma chemical vapor deposition using a mixture of methane (0.5% or 1.2%) and diborane (B2H6) below 50 ppm on either Si substrates or undoped diamond films that had been synthesized using 0.5% or 1.2% methane. The surface morphologies of the synthesized films were observed by Secondary Electron Microscopy, and the infrared absorption and Raman spectra were measured. It was found that when diborane concentration was low, B-doped films preferred (111) facets. On the other hand, high diborane concentrations resulted in a deposition of needle-like material that was identified as graphite by x-ray diffraction.

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Articles
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1Poferl, D. J., Gardner, N. C., and Angus, J. C., J. Appl. Phys. 44, 1428 (1973).CrossRefGoogle Scholar
2Fujimori, N., Imai, T., and Doi, A., Vacuum 36, 99 (1986).CrossRefGoogle Scholar
3Sato, Y., Kamo, M., and Setaka, N., Mater. Sci. Monogr. 38B (High Tech Ceram.), Pt. B, 1719 (1987).Google Scholar
4Everson, M. P. and Tamor, M. A., J. Vac. Sci. Technol. B 9, 1570 (1991).CrossRefGoogle Scholar
5Everson, M. and Tamor, M. A., J. Mater. Res. 7, 1438 (1992).CrossRefGoogle Scholar
6Prins, J. F., Thin Solid Films 212, 11 (1992).CrossRefGoogle Scholar
7Wang, X. H., Ma, G. H. M, Zhu, W., Glass, J. T., Bergman, L., Turner, K. F., and Nemanich, R. J., Diamond Relat. Mater. 1, 828 (1992).CrossRefGoogle Scholar
8Shiomi, H., Nakahata, H., Imai, T., Nishibayashi, Y., and Fujimori, N., Ipn. J. Appl. Phys. 28, 758 (1989).CrossRefGoogle Scholar
9Mort, J., Okumura, D., Machonkin, M. A., Morgan, M., Jansen, F., Okumura, K., LeGrice, Y., and Nemanich, R., Appl. Phys. Lett. 55, 1121 (1989).CrossRefGoogle Scholar
10Fujimori, N., Nakahata, H., and Imai, T., Jpn. J. Appl. Phys. 29, 824 (1990).CrossRefGoogle Scholar
11Nishimura, U. K., Das, K., Glass, J. T., Kobashi, K., and Nemanich, R. J., NATO ASI Ser. E 185, 183 (1990).Google Scholar
12Shiomi, H., Nishibayashi, Y., and Fujimori, N., Jpn. J. Appl. Phys. 30, 1363 (1991).CrossRefGoogle Scholar
13Grot, S. A., Hatfield, C. W., Gildenblat, G. Sh., Badzian, A. R., and Badzian, T., Appl. Phys. Lett. 58, 1542 (1991).CrossRefGoogle Scholar
14Nishimura, K., Das, K., and Glass, J. T., J. Appl. Phys. 69, 3142 (1991).CrossRefGoogle Scholar
15Ramesham, R., Roppel, T., Ellis, C., and Loo, B. H., J. Electrochem. Soc. 138, 2981 (1991).CrossRefGoogle Scholar
16Narducci, D., Guarnieri, C. R., and Cuomo, J. J., J. Electrochem. Soc. 138, 2446 (1991).CrossRefGoogle Scholar
17Harper, R. E., Johnston, C., Chalker, P. R., Totterdell, D., Buckley-Golder, I. M., Werner, M., Obermeier, E., and van Rossum, M., Diamond Relat. Mater. 1, 692 (1992).CrossRefGoogle Scholar
18Das, K., Venkatesan, V., Miyata, K., Dreifus, D., and Glass, J. T., Thin Solid Films 212, 19 (1992).CrossRefGoogle Scholar
19Tachibana, T., Williams, B. E., and Glass, J. T., Phys. Rev. B 45, 11698 (1992); ibid. B 45, 11975 (1992).Google Scholar
20Venkatesan, V., Das, K., Fountain, G. G., Rudder, R. A., Posthill, J. B., and Markunas, R. J., J. Electrochem. Soc. 139, 1445 (1992).CrossRefGoogle Scholar
21Miyata, K., Dreifus, D. L., and Kobashi, K., Appl. Phys. Lett. 60, 480 (1992).CrossRefGoogle Scholar
22Kobashi, K., Nishimura, K., Miyata, K., Kawate, Y., Glass, J., and Williams, B., Proc. SPIE-Int. Soc. Opt. Eng. 969 (Diamond Optics), 159 (1989).Google Scholar
23Mort, J., Machonkin, M. A., and Okumura, K., Appl. Phys. Lett. 58, 1908 (1991).CrossRefGoogle Scholar
24Stoner, B. R., Glass, J. T., Bergman, L., Nemanich, R. J., Zoltan, L. D., and Vandersande, J. W., J. Electron. Mater. 21, 629 (1992).CrossRefGoogle Scholar
25Ruan, J., Kobashi, K., and Choyke, W. J., Appl. Phys. Lett. 60, 1884 (1992).CrossRefGoogle Scholar
26Shiomi, H., Nishibayashi, Y., and Fujimori, N., Jpn. J. Appl. Phys. 28, L2153 (1985).CrossRefGoogle Scholar
27Kato, R., Nishimura, K., Miyauchi, S., and Kobashi, K., Abstracts of the 5th Diamond Symposium (Tsukuba, Japan, December 1991), p. 114.Google Scholar
28Werner, M., Schlichtig, V., and Obermeier, E., Diamond Relat. Mater. 1, 669 (1992).CrossRefGoogle Scholar
29Bade, J. P., Stoner, B. R., von Windheim, J. A., Glass, J. T., Miyata, K., Nishimura, K., and Kobashi, K., Abstracts of the 3rd International Conference on the New Diamond Science and Technology (Heidelberg, Germany, August 1992), No. 13.75.Google Scholar
30Chalker, P. R., Johnston, C., Crossley, J. A. A, Ambrose, J., Ayres, C. F., Harper, R. E., Buckley-Golder, I. M., and Kobashi, K., Abstracts of the 3rd International Conference on the New Diamond Science and Technology (Heidelberg, Germany, August 1992), No. 20.3.Google Scholar
31Prins, J. F., Appl. Phys. Lett. 41, 950 (1982).CrossRefGoogle Scholar
32Geis, M. W., Rathman, D. D., Ehrlich, D. J., Murphy, R. A., and Lindley, W. T., IEEE Electron Device Lett. EDL–8, 341 (1987).CrossRefGoogle Scholar
33Shiomi, H., Nishibayashi, Y., and Fujimori, N., Jpn. J. Appl. Phys. 28, L2153 (1989).CrossRefGoogle Scholar
34Geis, M. W., Gregory, J., and Pate, B., IEEE Trans. Electron Device 38, 619 (1991).CrossRefGoogle Scholar
35Fujimori, N., Nishibayashi, Y., and Shiomi, H., Jpn. J. Appl. Phys. 30, 1728 (1991).CrossRefGoogle Scholar
36Hewett, C. A. and Zeidler, J. R., Diamond Relat. Mater. 1, 688 (1992).CrossRefGoogle Scholar
37G. Sh. Gildenblat, Grot, S. A., Hatfield, C. W., and Badzian, A. R., IEEE Electron Device Lett. EDL–12, 37 (1991).Google Scholar
38Zeisse, C. R., Hewett, C. A., Nguyen, R., Zeidler, J. R., and Wilson, C. G., IEEE Electron Device Lett. EDL–12, 602 (1991).CrossRefGoogle Scholar
39Tsai, W., Delflno, M., Dodul, D., Riaziat, M., Ching, L. Y., Reynolds, G., and Cooper, C. B. III, IEEE Electron Device Lett. EDL–12, 157 (1991).CrossRefGoogle Scholar
40Nishimura, K., Kato, R., Miyauchi, S., Kumagai, K., and Kobashi, K., Abstracts of the Fall Meeting of the Japan Applied Physics Society, 12p-9-8 (Okayama, Japan, October 1991), p. 494.Google Scholar
41Tessmer, A. J., Das, K., and Dreifus, D. L., Diamond Relat. Mater. 1, 89 (1992).CrossRefGoogle Scholar
42Davis, R. F., Sitar, Z., Williams, B. E., Kong, H. S., Kim, H. J., Palmour, J. W., Edmond, J. A., Ryu, J., Glass, J. T., and Carter, C. H. Jr., Mater. Sci. Eng. Bl, 77 (1988).CrossRefGoogle Scholar
43G. Sh. Gildenblat, Grot, S. A., and Badzian, A. R., Proc. IEEE 79, 5 (1991).Google Scholar
44However, see Collins, A. T., Mater. Sci. Eng. Bll, 257 (1992).CrossRefGoogle Scholar
45Sato, Y., private communication (1985).Google Scholar
46Sakata, M., Nishizawa, S., Nishimura, K., Kobashi, K., Ma, M., and Glass, J. T., Abstracts of the Spring Meeting of the Japan Applied Physics Society, 29P-ZY–2 (Chiba, Japan, March 1992), p. 421.Google Scholar
47Kobashi, K., Nishimura, K., Kawate, Y., and Horiuchi, T., Phys. Rev. B 38, 4067 (1988).CrossRefGoogle Scholar
48Kobashi, K., Nishimura, K., Miyata, K., Kumagai, K., and Nakaue, A., J. Mater. Res. 5, 2469 (1990).CrossRefGoogle Scholar
49Bade, J. P., Stoner, B. R., von Windheim, J. A., Glass, J. T., Miyata, K., Nishimura, K., and Kobashi, K., Abstracts of the 3rd International Conference on the New Diamond Science and Technology (Heidelberg, Germany, August 1992), No. 13.75.Google Scholar