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Chemical Solution Deposition of Lanthanum Zirconate Buffer Layers on Biaxially Textured Ni–1.7% Fe–3% W Alloy Substrates for Coated-conductor Fabrication

Published online by Cambridge University Press:  31 January 2011

S. Sathyamurthy
Affiliation:
Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6100
M. Paranthaman
Affiliation:
Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6100
T. Aytug
Affiliation:
Chemical Sciences Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6100
B. W. Kang
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6116
P. M. Martin
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6116
A. Goyal
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6116
D. M. Kroeger
Affiliation:
Metals and Ceramics Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6116
D. K. Christen
Affiliation:
Solid State Division, Oak Ridge National Laboratory, Oak Ridge, Tennessee 37831–6061
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Abstract

Sol-gel processing of La2Zr2O7 (LZO) buffer layers on biaxially textured Ni–1.7% Fe–3% W alloy substrates using a continuous reel-to-reel dip-coating unit has been studied. The epitaxial LZO films obtained have a strong cube texture and uniform microstructure. The effects of increasing the annealing speed on the texture, microstructure, and carbon content retained in the film were studied. On top of the LZO films, epitaxial layers of yttria-stabilized zirconia and Ceria (CeO2) were deposited using rf sputtering, and YBa2Cu3Ox (YBCO) films were then deposited using pulsed laser deposition. Critical current densities (Jc) of 1.9 MA/cm2 at 77 K and self-field and 0.34 MA/cm2at 77 K and 0.5 T have been obtained on these films. These values are comparable to those obtained on YBCO films deposited on all-vacuum deposited buffer layers and the highest ever obtained using solution seed layers.

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Articles
Copyright
Copyright © Materials Research Society 2002

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