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Defect/surface interactions in heat-treated ceramic thin films

Published online by Cambridge University Press:  31 January 2011

David W. Susnitzky  and
C. Barry Carter
David W. Susnitzky
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
C. Barry Carter*
Affiliation:
Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853
*
b)Address correspondence to this author, Dept. Chem. E. & Mat. S., University of Minnesota, Minneapolis, Minnesota 55455–0132.
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Abstract

The use of transmission electron microscopy to study the interaction of lattice defects with surfaces of heat-treated ceramic materials is discussed. The approach used throughout the work described has been to prepare a thinned sample in a form suitable for imaging in the electron microscope and then to remove all preparation-induced damage by heat-treating the thinned sample. Applications of the technique to the movement and pinning of individual surface steps in alumina and the grooving of antiphase boundaries in silicon carbide are illustrated.

Type
Articles
Information
Journal of Materials Research , Volume 6 , Issue 11 , November 1991 , pp. 2403 - 2411
Copyright
Copyright © Materials Research Society 1991

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