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Examination of the material properties and performance of thin-diamond film cutting tool inserts produced by arc-jet and hot filament chemical vapor deposition

Published online by Cambridge University Press:  31 January 2011

James M. Olson
Affiliation:
Saint-Gobain/Norton Diamond Film, Goddard Road, Northboro, Massachusetts 01532
Michael J. Dawes
Affiliation:
Saint-Gobain/Norton Diamond Film, Goddard Road, Northboro, Massachusetts 01532
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Abstract

Thin diamond film coated WC-Co cutting tool inserts were produced using arc-jet and hot-filament chemical vapor deposition. The diamond films were characterized using SEM, XRD, and Raman spectroscopy to examine crystal structure, fracture mode, thickness, crystalline orientation, diamond quality, and residual stress. The performance of the tools was evaluated by comparing the wear resistance of the materials to brazed polycrystalline diamond-tipped cutting tool inserts (PCD) while machining A390 aluminum (18% silicon). Results from the experiments carried out in this study suggest that the wear resistance of the thin diamond films is primarily related to the grain boundary strength, crystal orientation, and the density of microdefects in the diamond film.

Type
Articles
Copyright
Copyright © Materials Research Society 1996

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References

REFERENCES

1.Hoff, H.A., Morrish, A.A., Carrington, W.A., Butler, J.E., and Rath, B.B., in Diamond, Silicon Carbide and Related Wide Bandgap Semiconductors, edited by Glass, J.T., Messier, , and Fujimori, N. (Mater. Res. Soc. Symp. Proc. 162, Pittsburgh, PA, 1990), pp. 279284.Google Scholar
2.Hoff, H.A., Morrish, A.A., Butler, J.E., and Rath, B.B., J. Mater. Res. 5, 25722588 (1990).CrossRefGoogle Scholar
3.Gray, K., Olson, J., and Windischmann, H., Proc. MRS Meeting, April 1995.Google Scholar
4.Touloukean, Y. S., Thermophysical Properties of Matter (IPI/Plenum, New York, 1977), Vol. 13.Google Scholar
5.Klein, C. and Cardinale, G., Diamond Relat. Mater. 2, 918923 (1993).CrossRefGoogle Scholar
6.Wild, C., Koidl, P., Muller-Sebert, W., Walcher, H., Kohl, R., Herres, N., Locher, R., Samlenski, R., and Brenn, R., Diamond Relat. Mater. 2 158168 (1993).CrossRefGoogle Scholar
7.Knight, D. and White, W., J. Mater. Res. 4, 385393 (1989).CrossRefGoogle Scholar
8.Bou, P. and Vandenbulcke, L., J. Electrochemical Soc. 138 (4), 29913000 (Oct. 1991).CrossRefGoogle Scholar
9.Bachmann, P. K., Bausen, H. D., Lade, H., Leers, D., Wiechert, D. U., Herres, N., Kohl, R., and Koidl, P., Proc. Diamond Films '93, Paper no. 12.023.Google Scholar
10.Nemanich, R. J., Bergman, L., LeGrice, Y.M., and Scroder, R. E., in New Diamond Science and Technology, edited by Messier, R., Glass, J.T., Butler, J.E., and Roy, R. (Mater. Res. Soc. Int. Symp. Proc. NDST-2, Pittsburgh, PA, 1991).Google Scholar
11.Yarbrough, W. and Roy, R., in Extended Abstracts No. 15, Diamond and Diamond-Like Materials Synthesis, edited by Johnson, G. H., Badzian, A. R., and Geis, M. W. (Materials Research Society, Pittsburgh, PA 1988).Google Scholar
12. ASTM Powder Diffraction File 66–0675 (1967).Google Scholar
13.Wanlu, W., Kejun, L., Jinying, G., and Aimin, L., Thin Solid Films 215, 174 (1992).CrossRefGoogle Scholar
14.Gruen, D.M., Pan, X., Drauss, A. R., Liu, S., Luo, J., and Foster, C.M., J. Vac. Sci. Technol. A 12 (4), 14911495 (Jul/Aug 1994).CrossRefGoogle Scholar
15.LeGrice, Y. M., Nemanich, R. J., Glass, J.T., Lee, Y. H., Rudder, R. A., and Markunas, R. J., in Diamond Silicon Carbide and Related Wide Bandgap Semiconductors, edited by Glass, J. T., Messier, R., and Fujimori, N. (Mater. Res. Soc. Symp. Proc. 162, Pittsburgh, PA, 1990), p. 219.Google Scholar
16.Lawn, B., Fracture of Brittle Solids, 2nd ed. (Cambridge University Press, Cambridge, 1993).CrossRefGoogle Scholar
17.Windischmann, H., personal conversation.Google Scholar