Hostname: page-component-cd9895bd7-7cvxr Total loading time: 0 Render date: 2024-12-28T01:27:24.540Z Has data issue: false hasContentIssue false
  • English
  • Français

Influence of Substrates on the Crystal Structure of Pulsed Laser Deposited Pb(Mg1/3Nb2/3)O3–29% PbTiO3 Thin Films

Published online by Cambridge University Press:  31 January 2011

Jung-Kun Lee ,
Hyun-Suk Jung ,
Dong-Wan Kim ,
Chang-Hoon Kim  and
Kug Sun Hong
Jung-Kun Lee
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–742, Korea
Hyun-Suk Jung
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–742, Korea
Dong-Wan Kim
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–742, Korea
Chang-Hoon Kim
Affiliation:
Department of Materials Science & Engineering, Case Western Reserve University, Cleveland, Ohio 44106–7204
Kug Sun Hong
Affiliation:
School of Materials Science and Engineering, Seoul National University, Seoul 151–742, Korea
Get access

Extract

Lead magnesium niobate–lead titanate [Pb(Mg1/3Nb2/3)O3 (PMN)–PbTiO3 (PT)] films were synthesized using pulsed laser deposition, and the effect of substrates on the deposition behavior of the PMN–PT film was investigated. Phase evolution of PMN–PT thin films was found to depend significantly on the type of the substrate used during deposition. Though a mixture of pyrochlore and perovskite was observed when films were deposited on a Pt/TiO2/SiO2/Si substrate, the oxide substrates, such as (Ba0.5Sr0.5)RuO3/Si, SrTiO3, and LaAlO3, enabled the deposition of pure perovskite. Scanning Auger microprobe, transmission electron microscope, and x-ray diffraction analysis showed that an interfacial layer between the substrates and the oxide film was central to the phase evolution behavior. On the Pt/TiO2/SiO2/Si substrate, an interfacial layer of lead–platinum (Pb–Pt) played a major role in the formation of the pyrochlore phase. However, on oxide substrates, there was no interfacial layer and interdiffusion of A-site cations was observed between the PMN film and the oxide electrodes.

Type
Articles
Information
Journal of Materials Research , Volume 17 , Issue 5 , May 2002 , pp. 1030 - 1034
Copyright
Copyright © Materials Research Society 2002

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1.Shrout, T.R. and Halliyal, A., Am. Ceram. Soc. Bull. 56, 704 (1984).Google Scholar
2.Cross, L.E., Ferroelectrics 76, 241 (1987).CrossRefGoogle Scholar
3.Sabolsky, E.M., James, A.R., Kwon, S., Trolier-Mckinstry, S., and Messing, G.L., Appl. Phys. Lett. 78, 2551 (2001).CrossRefGoogle Scholar
4.Francis, L.F. and Payne, D.A., J. Am. Ceram. Soc. 74, 3000 (1991).CrossRefGoogle Scholar
5.Kighelman, Z., Damjanovic, D., Seifert, A., Sagalowicz, L., and Setter, N., Appl. Phys. Lett. 73, 2281 (1998).CrossRefGoogle Scholar
6.Maria, J-P., Hackenberger, W., and Trolier-McKinstry, S., J. Appl. Phys. 84, 5147 (1998).CrossRefGoogle Scholar
7.Mergan, A. and Lee, W.E., J. Eur. Ceram. Soc. 17, 1033 (1997).CrossRefGoogle Scholar
8.Sreedhar, K. and Mitra, A., Mater. Res. Bull. 32, 1643 (1997).CrossRefGoogle Scholar
9.Wakiya, N., Shinozaki, K., and Mizutani, N., Thin Solid Films 384, 189 (2001).CrossRefGoogle Scholar
10.Verardi, P., Dinescu, M., Craciun, F., Dinu, R., and Vrejoiu, I., Appl. Surf. Sci. 168, 340 (2000).CrossRefGoogle Scholar
11.Huang, Z., Zhang, Q., and Whatmore, R.W., J. Appl. Phys. 86, 1662 (1999).CrossRefGoogle Scholar
12.Brook, K.G., Reaney, I.M., Klissurska, R., Huang, Y., Bursill, L., and Setter, N., J. Mater. Res. 9, 2540 (1994).CrossRefGoogle Scholar
13.Chen, S-Y. and Chen, I-W., J. Am. Ceram. Soc. 77, 2332 (1994).CrossRefGoogle Scholar
14.Wakiya, N., Shinozaki, K., and Mizutani, N., J. Am. Ceram. Soc. 80, 3217 (1997).CrossRefGoogle Scholar
15.Kusumoto, K. and Sekiya, T., Mater. Res. Bull. 33, 1367 (1998).CrossRefGoogle Scholar
16.Huang, Z., Zhang, Q., and Whatmore, R.W., J. Appl. Phys. 85, 7355 (1999).CrossRefGoogle Scholar
17.Escure, P., Lattard, E., Lejeune, M., and Baumard, J.F., J. Mater. Sci. 31, 3937 (1996).CrossRefGoogle Scholar
18.Sekar, M.M.A., Halliyal, A., and Patil, K.C., J. Mater. Res. 11, 1210 (1996).CrossRefGoogle Scholar
19.Chung, S-O., Kim, J.W., Kim, G.H., Park, C.O., and Lee, W.J., Jpn. J. Appl. Phys. 36, 4386 (1997).CrossRefGoogle Scholar