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Observation and analysis of extended dislocations in an Al–Pd–Mn icosahedral quasicrystal by transmission electron microscopy

Published online by Cambridge University Press:  03 March 2011

Jianglin Feng ,
Renhui Wang  and
Mingxing Dai
Jianglin Feng
Affiliation:
Department of Physics, Wuhan University, 430072 Wuhan, and Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, 100080 Beijing, P.O. Box 2724, People's Republic of China
Renhui Wang
Affiliation:
Department of Physics, Wuhan University, 430072 Wuhan, and Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, 100080 Beijing, P.O. Box 2724, People's Republic of China
Mingxing Dai
Affiliation:
Department of Physics, Wuhan University, 430072 Wuhan, and Beijing Laboratory of Electron Microscopy, Chinese Academy of Sciences, 100080 Beijing, P.O. Box 2724, People's Republic of China
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Abstract

Extended dislocations including partial dislocations and a stacking fault in Al70Pd20Mn10 icosahedral quasicrystal have been observed and identified for the first time. The diffraction contrast and defocus convergent-beam electron diffraction experiments show that the dissociation of the extended dislocations is of the form 1/2<1 −2 0 0 −2 1> → 1/4<1 −3 1 −1 −1 1>+ 1/4<1 −1 −1 1 −xs3 1> with a stacking fault between these two partial dislocations. For the partial dislocations, the Burgers vector components in physical space bpart are along different fivefold axes with a magnitude of 0.17 nm, which is about one seventh of that in complementary space. For the perfect dislocation, the Burgers vector component in physical subspace bperf is along a twofold axis with a magnitude of 0.183 nm, which is about an eleventh of that in complementary space.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 11 , November 1995 , pp. 2742 - 2748
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Kleman, , Gefen, Y., and Pavlovitch, A., Europhys. Lett. 1, 61 (1986).CrossRefGoogle Scholar
2Ovidko, LA., Mater. Sci. Eng. A 154, 29 (1992).CrossRefGoogle Scholar
3Levine, D., Lubensky, T. C., Ostlund, S., Ramaswamy, S., Steinhardt, P.J., and Toner, J., Phys. Rev. Lett. 54, 1520 (1985).CrossRefGoogle Scholar
4Lubensky, T. C., Ramaswamy, S., and Toner, J., Phys. Rev. B 32, 744 (1985).CrossRefGoogle Scholar
5Socolar, J. E. S., Lubensky, T.C., and Steinhardt, P.J., Phys. Rev. B 34, 3345 (1986).CrossRefGoogle Scholar
6Wollgarten, M., Gratias, D., Zhang, Z., and Urban, K., Philos. Mag. A 64, 819 (1991).CrossRefGoogle Scholar
7Feng, J.L. and Wang, R., J. Phys. Cond.: Matter 6, 6437 (1994).CrossRefGoogle Scholar
8Devaud-Rzepski, J., Cornier-Quiquandon, M., and Gratias, D., Proceedings of the Third International Conference on Quasicrystals, edited by Yacaman, M.J., Romeu, D., Castno, V., and Gomez, A. (World Scientific, Singapore, 1989), p. 498.Google Scholar
9Feng, J.L. and Wang, R., Philos. Mag. A 69, 981 (1994).CrossRefGoogle Scholar
10Wang, R. and Dai, M., Phys. Rev. B 47, 15326 (1993).Google Scholar
11Dai, M.X., Philos. Mag A 67, 789 (1993).CrossRefGoogle Scholar
12Feng, J.L., Wang, R., and Wang, Z.G., Philos. Mag. Lett. 68, 321 (1993).CrossRefGoogle Scholar
13Feng, J.L. and Wang, R., Philos. Mag. Lett. 60, 309 (1994).CrossRefGoogle Scholar
14Hiraga, K. and Hirabayashi, M., Jpn. J. Appl. Phys. 26, L155 (1987).CrossRefGoogle Scholar
15Wollgarten, M., Beyss, M., and Urban, K., Phys. Rev. Lett. 71, 549 (1993).CrossRefGoogle Scholar
16Elser, V., Acta Crystallogr. A 42, 36 (1986).CrossRefGoogle Scholar
17Boudard, M., Boissieu, M., Janot, C., Heger, G., Beeli, C., Nissen, H. U., Vincent, H., Audier, M., and Dubois, J. M., J. Non-Cryst. Solids 153–154, 5 (1993).CrossRefGoogle Scholar
18Hirsch, P.B., Howie, A., Nicholson, R.B., Pashley, D.W., and Whelan, M. J., Electron Microscopy of Thin Crystals (Krieger, Huntington, 1977), p. 208.Google Scholar