Hostname: page-component-cd9895bd7-gbm5v Total loading time: 0 Render date: 2024-12-30T22:38:22.301Z Has data issue: false hasContentIssue false

Phase analysis of sintered yttria–zirconia ceramics by x-ray diffraction

Published online by Cambridge University Press:  31 January 2011

A. Paterson
Affiliation:
National Institute for Materials Research, CSIR, P.O. Box 395, Pretoria, South Africa
R. Stevens
Affiliation:
Department of Ceramics, University of Leeds, Leeds LS2 9JT, England
Get access

Abstract

Determination of the amount of cubic and tetragonal phase in yttria–zirconia using high-angle XRD (x-ray diffraction) has been complicated by problems of resolution and interpretation. The evidence, from electron diffraction studies, for a ct shear transformation also needs to be taken into account. Two compositions, a 3 and a 5.7 mol % Y2O3−ZrO2, were sintered and thermally treated at different temperatures between 1450°and 1700°C. X-ray diffraction traces revealed the anticipated tetragonal (400) and (004) reflections. The region of the diffraction pattern that was thought to arise from the cubic phase could be best interpreted as a second tetragonal phase t'. The original amount of cubic phase computed from the t' reflections showed good agreement with the phase diagram of Scott. The lattice parameters of the t' phase were determined, and the volume of the tetragonal (t') unit cell was calculated.

Type
Articles
Copyright
Copyright © Materials Research Society 1986

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1Garvie, R. C. and Nicholson, P. S., J. Am. Ceram. Soc. 55, 303 (1972).Google Scholar
2Evans, P. A., Stevens, R., and Binner, J. G. P., Trans. J. Brit. Ceram. Soc. 83, 39 (1984).Google Scholar
3Toraya, H., Yoshimura, M., and Somiya, S., J. Am. Ceram. Soc. 67, C183 (1984).CrossRefGoogle Scholar
4Toraya, H., Yoshimura, M., and Somiya, S., J. Am. Ceram. Soc. 67, C119 (1984).CrossRefGoogle Scholar
5Garvie, R. C., Hannink, R. H., and Pascoe, R. T., Nature 258, 703 (1975).CrossRefGoogle Scholar
6Miller, R. A., Smialek, J. L., and Garlick, R. G., in Advances in Ceramics, edited by Heuer, A. H. and Hobbs, L. W. (American Ceramic Society (Columbus, OH, 1981), Vol. 3, pp. 241253.Google Scholar
7Porter, D. L. and Heuer, A. H., J. Am. Ceram. Soc. 62, 298 (1979).CrossRefGoogle Scholar
8Scott, H. G., J. Mater. Sci. 10, 1527 (1975).Google Scholar
9Gupta, T. K., Bechtold, J. H., Kuznicki, L. J., and Rossing, B. R., J. Mater. Sci. 12, 2421 (1977).CrossRefGoogle Scholar
10Hannink, R. H. J., J. Mater. Sci. 13, 2487 (1978).CrossRefGoogle Scholar
11Andersson, C. A. and Gupta, T. K., in Ref. 6, pp. 184210.Google Scholar
12Andersson, C. A., Greggi, J., and Gupta, T. K., in Advances in Ceramics, edited by Claussen, N., Ruhle, M., and Heuer, A. H. (American Ceramic Society, Columbus, OH, 1984), Vol. 12, pp. 7885.Google Scholar
13Cullity, B. D., Elements of X-ray Diffraction (Addison-Wesley, Reading, MA, 1978).Google Scholar