Hostname: page-component-78c5997874-ndw9j Total loading time: 0 Render date: 2024-11-13T04:36:32.643Z Has data issue: false hasContentIssue false
  • English
  • Français

Processing of epitaxial LiMn2O4 thin film on MgO(110) through metalorganic precursor

Published online by Cambridge University Press:  31 January 2011

Yumi H. Ikuhara ,
Yuji Iwamoto ,
Koichi Kikuta  and
Shin-ichi Hirano
Yumi H. Ikuhara
Affiliation:
Fine Ceramics Research Association, Synergy Ceramics Laboratory, 2–4-1 Mutsuno, Atsuta-ku, Nagoya, 456–8587, Japan
Yuji Iwamoto
Affiliation:
Fine Ceramics Research Association, Synergy Ceramics Laboratory, 2–4-1 Mutsuno, Atsuta-ku, Nagoya, 456–8587, Japan
Koichi Kikuta
Affiliation:
Graduate School of Engineering, Nagoyua University, Furo-cho, Chikusa-ku, Nagoya, 464–8603, Japan
Shin-ichi Hirano
Affiliation:
Graduate School of Engineering, Nagoyua University, Furo-cho, Chikusa-ku, Nagoya, 464–8603, Japan
Get access

Abstract

Epitaxial LiMn2O4 was successfully synthesized by coating a [Li–Mn–O] metalorganic precursor solution onto MgO (110) substrates at temperatures as low as 350 °C. Cross-sectional transmission electron microscopy observation revealed that the orientation relationship between LiMn2O4 and MgO was (111) LiMn2O4 //(111) MgO, (110) LiMn2O4 //(110) MgO, and [112] LiMn2O4 //[112] MgO, which resulted in the (111) LiMn2O4 planes growing perpendicular to the surface plane of MgO. The interface structure consisted of (111) layers of Mn atoms in the LiMn2O4 crystal aligned with the Mg atoms in the (111) planes of the MgO substrate when viewed along the [112] direction.

Type
Articles
Information
Journal of Materials Research , Volume 15 , Issue 12 , December 2000 , pp. 2750 - 2757
Copyright
Copyright © Materials Research Society 2000

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Thackeray, M.M., Johnson, P.J., de Picciotto, L.A., Bruce, P.G., and Goodenough, J.B., Mater. Res. Bull. 19, 179 (1984).CrossRefGoogle Scholar
2.Bach, S., Pereira-Ramos, J.P., Baffier, N., and Messina, R., Electrochem. Acta 37, 1301(1992).CrossRefGoogle Scholar
3.Rossouw, M.H., de Kock, A., de Picciotto, L.A., Thackeray, M.M., David, W.I.F, and Ibberson, R.M., Mater. Res. Bull. 25, 173 (1990).CrossRefGoogle Scholar
4.Ohzuku, T., Kitagawa, M., and Taketsugu, H., J. Electrochem. Soc. 137, 769 (1990).CrossRefGoogle Scholar
5.Huang, H. and Bruce, P.G., J. Electrochem. Soc. 141, 185 (1994).CrossRefGoogle Scholar
6.Tarascon, J.M., McKinnon, W.R., Coowar, F., Bowmer, T.N., Amatucci, G., and Guyomard, D., J. Electrochem. Soc. 141, 1421 (1994).CrossRefGoogle Scholar
7.Gummow, R.J., de Kock, A., and Thackeray, M.M., Solid State Ionics 69, 59 (1994).CrossRefGoogle Scholar
8.Masquelier, C., Tabuchi, M., Ando, K., Kanno, R., Kobayashi, Y., Maki, Y., Nakamura, O., and Goodenough, J.B., J. Solid State Chem. 23, 256 (1996).Google Scholar
9.Guyomard, D. and Tarascon, J.M., J. Electrochem. Soc. 139, 937 (1992).CrossRefGoogle Scholar
10.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., J. Mater. Res. 14, 3102 (1999).CrossRefGoogle Scholar
11.Reimers, J.N. and Dahn, J.R., J. Electrochem. Soc. 139, 2091 (1992).CrossRefGoogle Scholar
12.Gummow, R.J., Liles, D.C., Thackeray, M.M., and David, W.I.F, Mater. Res. Bull. 28, 1177 (1993).CrossRefGoogle Scholar
13.Thomas, M.G.S.R, David, W.I.F, Goodenough, J.B., and Gloves, P., Mater. Res. Bull. 20, 1137 (1985).CrossRefGoogle Scholar
14.Dahn, J.R., von Sacken, U., and Michael, C.A., Solid State Ionics 44, 87 (1990).CrossRefGoogle Scholar
15.Hirano, A., Kanno, R., Kawamoto, Y., Takeda, Y., Yamaura, K., Takano, M., Ohyama, K., Ohashi, M., Yamaguchi, Y., Solid State Ionics 78, 123 (1995).CrossRefGoogle Scholar
16.Fragnaud, P., Nagarajan, R., Scaleich, D.M., and Vujic, D., J. Power Sources 54, 362 (1995).CrossRefGoogle Scholar
17.Shokoohi, F.K., Tarascon, J.M., and Wilkens, B.J., Appl. Phys. Lett. 59, 1260 (1991).CrossRefGoogle Scholar
18.Shokoohi, F.K., Tarascon, J.M., Wilkens, B.J., Guyomard, D., and Chang, C.C., J. Electrochem. Soc. 139, 1845 (1992).CrossRefGoogle Scholar
19.Antaya, M., Dahn, J.R., Preston, J.S., Rosen, E., and Reimers, J.N., J. Electrochem. Soc. 140, 575 (1993).CrossRefGoogle Scholar
20.Antaya, M., Cleams, K., Preston, J.S., Reimers, J.N., and Dahn, J.R., J. Appl. Phys. 76, 2799 (1994).CrossRefGoogle Scholar
21.Hwang, K-H., Lee, S-H., and Joo, S-K., J. Electrochem. Soc. 41, 3296 (1994).CrossRefGoogle Scholar
22.Bates, J.B., Gruzalski, G.R., Dadney, N.J., Luck, C.F., and Yu, X., Solid State Ionics 70/71, 619 (1994).CrossRefGoogle Scholar
23.Bates, J.B., Lubben, D., Dudney, L.J., and Harf, F.X., J. Electrochem. Soc. 142, L149 (1995).CrossRefGoogle Scholar
24.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., Hirano, S., IONICS 6, 156 (2000).CrossRefGoogle Scholar
25.Ikuhara, Y.H., Iwamoto, Y., Kikuta, K., and Hirano, S., Ceram. Trans. 83, 53 (1998).Google Scholar