Hostname: page-component-78c5997874-v9fdk Total loading time: 0 Render date: 2024-11-13T01:49:22.674Z Has data issue: false hasContentIssue false

Superconducting YBa2Cu3Ox films prepared on YSZ polycrystalline substrates by rf thermal plasma evaporation

Published online by Cambridge University Press:  03 March 2011

J. Tsujino
Affiliation:
Superconducting Research Laboratory, ISTEC, 10-13 Shinonome, Koto-ku, Tokyo 135, Japan
N. Tatsumi
Affiliation:
Superconducting Research Laboratory, ISTEC, 10-13 Shinonome, Koto-ku, Tokyo 135, Japan
Y. Shiohara
Affiliation:
Superconducting Research Laboratory, ISTEC, 10-13 Shinonome, Koto-ku, Tokyo 135, Japan
Get access

Abstract

As-grown YBa2Cu3Ox films prepared on single crystal (100)MgO substrates by rf thermal plasma evaporation have the advantages of a high deposition rate of 730 nm/min, a large area deposition over 300 cm2, and a high Jc of 6.8 × 105 A/cm2 (77 K, O T), as reported in previous papers.1,2 We report in this paper about the preparation of YBa2Cu3Ox films on yttria-stabilized zirconia (YSZ) polycrystalline substrates for a practical application using this technique to synthesize these films on flexible (metal or flexible polycrystal) substrates. Films prepared on YSZ polycrystalline substrates grew with a c-axis orientation at a relatively high deposition rate and exhibited a zero resistance temperature (TcO) of 88 K and a critical current density Jc of 3500 A/cm2 (77 K, O T). Films prepared on flexible YSZ polycrystalline tapes with a length of 100 mm were also grown with a c-axis orientation and exhibited TcO) over 77 K.

Type
Articles
Copyright
Copyright © Materials Research Society 1994

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Yuhya, S., Kikuchi, K., Shiohara, Y., Terashima, K., and Yoshida, T., J. Mater. Res. 7, 2673 (1992).CrossRefGoogle Scholar
2Kikuchi, K., Yuhya, S., and Shiohara, Y., J. Mater. Sci. Lett. 12, 1392 (1993).CrossRefGoogle Scholar
3Berry, A. D., Gaskill, D. K., Holm, R. T., Cukauskas, E. J., and Henry, R. L., Appl. Phys. Lett. 52, 1743 (1988).CrossRefGoogle Scholar
4Enomoto, Y., Murakami, T., Suzuki, M., and Moriwaki, K., Jpn. J. Appl. Phys. 26, L1284 (1987).CrossRefGoogle Scholar
5Terashima, T., Iijima, K., Yamamoto, K., Bando, Y., and Mazaki, H., Jpn. J. Appl. Phys. 27, L91 (1988).CrossRefGoogle Scholar
6Venkatesan, T., Wu, X. D., Dutta, B., Inam, A., Hedge, M. S., Hwang, D. M., Chang, C. C., Nazar, L., and Wilkens, B., Appl. Phys. Lett. 54, 581 (1989).CrossRefGoogle Scholar
7Terashima, K., Eguchi, K., Yoshida, T., and Akashi, K., Appl. Phys. Lett. 52, 1274 (1988).CrossRefGoogle Scholar
8Terashima, K., Komaki, H., and Yoshida, T., IEEE Trans. Plasma Sci. 18, 980 (1990).CrossRefGoogle Scholar
9Hirokawa, Y., Takamura, Y., Komaki, H., Terashima, K., and Yoshida, T., J. Mater. Synthesis and Processing 1, 53 (1993).Google Scholar
10Iijima, Y., Onabe, K., Futaki, N., Tanabe, N., Sadakata, N., Kohno, O., and Ikeno, Y., Proc. 5th Int. Symp. on Superconductivity (Springer-Verlag, Tokyo, 1992), p. 661.Google Scholar
11Tatsumi, N., Tsujino, J., Yuhya, S., Kikuchi, K., and Shiohara, Y., Proc. 5th Int. Symp. on Superconductivity (Springer-Verlag, Tokyo, 1992), p. 665.Google Scholar
12Fujino, K., Yoshida, N., Takano, S., Okuda, S., Hara, T., Ishii, H., and Yamamoto, T., Proc. 5th Int. Symp. on Superconductivity (Springer-Verlag, Tokyo, 1992), p. 673.Google Scholar
13Chew, N. G., Goodyear, S. W., Edwards, J. A., Satchel, J. S., Blenkinsop, S. E., and Humphreys, R. G., Appl. Phys. Lett. 57, 2016 (1990).CrossRefGoogle Scholar
14Arikawa, T., Itozaki, H., Harada, K., Higashi, K., Tanaka, S., and Yazu, S., Jpn. J. Appl. Phys. 27, L91 (1988).Google Scholar
15Hamet, J. F., Mercy, B., Hervieu, M., and Raveau, B., Physica C 193, 465 (1992).CrossRefGoogle Scholar
16Dimos, D., Chaudhari, P., Mannhart, J., and LeGoues, F. K., Phys. Rev. Lett. 61, 219 (1988).CrossRefGoogle Scholar
17Dimos, D., Chaudhari, P., and Mannhart, J., Phys. Rev. B 41, 4038 (1990).CrossRefGoogle Scholar