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Transmission electron microscopy study of (103)-oriented epitaxial SrBi2Nb2O9 films grown on (111) SrTiO3 and (111) SrRuO3/(111) SrTiO3

Published online by Cambridge University Press:  31 January 2011

M. A. Zurbuchen ,
J. Lettieri ,
Y. Jia ,
D. G. Schlom ,
S. K. Streiffer  and
M. E. Hawley
M. A. Zurbuchen
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16803–6602
J. Lettieri
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16803–6602
Y. Jia
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16803–6602
D. G. Schlom
Affiliation:
Department of Materials Science and Engineering, The Pennsylvania State University, University Park, Pennsylvania 16803–6602
S. K. Streiffer
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
M. E. Hawley
Affiliation:
Materials Science and Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

Portions of the same epitaxial (103)-oriented SrBi2Nb2O9 film grown on (111) SrTiO3 for which we recently reported the highest remanent polarization (Pr) ever achieved in SrBi2Nb2O9 (or SrBi2Ta2O9) films, i.e., Pr = 15.7 μC/cm2, have been characterized microstructurally by plan-view and cross-sectional transmission electron microscopy (TEM) along three orthogonal viewing directions. SrBi2Nb2O9 grows with its c axis tilted 57° from the substrate surface normal in a three-fold twin structure about the substrate [111], with the growth twins' c axes nominally aligned with the three 〈100〉 SrTiO3 directions. (103) SrBi2Nb2O9 films with and without an underlying epitaxial SrRuO3 bottom electrode have been studied. Dark-field TEM imaging over a 12 μm2 area shows no evidence of second phases (crystalline or amorphous). A high density of out-of-phase boundaries exists in the films.

Type
Articles
Information
Journal of Materials Research , Volume 16 , Issue 2 , February 2001 , pp. 489 - 502
Copyright
Copyright © Materials Research Society 2001

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References

REFERENCES

1.Paz de Araujo, C.A., Cuchiaro, J.D., McMillan, L.D., Scott, M.C., and Scott, J.F., Nature (London) 374, 627 (1995).CrossRefGoogle Scholar
2.Sumi, T., Judai, Y., Hirano, K., Ito, T., Mikawa, T., Takeo, M., Azuma, M., Hayashi, S., Uemoto, Y., Arita, K., Nasu, T., Nagano, Y., Inoue, A., Matsuda, A., Fuji, E., Shimada, Y., and Otsuki, T., Jpn. J. Appl. Phys. 35, 1516 (1996).CrossRefGoogle Scholar
3.Suzuki, M., J. Ceram. Soc. Jpn. 103, 1099 (1995).CrossRefGoogle Scholar
4.Lettieri, J., Zurbuchen, M.A., Jia, Y., Schlom, D.G., Streiffer, S.K., and Hawley, M.E., Appl. Phys. Lett. 76, 2937 (2000).CrossRefGoogle Scholar
5.Aurivillius, B., Ark. Kemi 1, 463 (1950).Google Scholar
6.Aurivillius, B., Ark. Kemi 1, 499 (1950).Google Scholar
7.Aurivillius, B., Ark. Kemi 2, 519 (1951).Google Scholar
8.Aurivillius, B., Ark. Kemi 5, 39 (1953).Google Scholar
9.Aurivillius, B. and Fang, P.H., Phys. Rev. 126, 893 (1962).CrossRefGoogle Scholar
10.Rae, A.D., Thompson, J.G., Withers, R.L., and Willis, A.C., Acta Crystallogr. Sec. B 46, 474 (1990).CrossRefGoogle Scholar
11.Newnham, R.E., Wolfe, R.W., and Dorrian, J.F., Mater. Res. Bull. 6, 1029 (1971).CrossRefGoogle Scholar
12.Newnham, R.E., Wolfe, R.W., Horsey, R.S., Diaz-Colon, F.A., and Kay, M.I., Mater. Res. Bull. 8, 1183 (1973).CrossRefGoogle Scholar
13.International Tables for Crystallography, Volume A: Space-Group Symmetry (Kluwer Academic Publishers, Dordrecht, Germany 1996) p. 783.Google Scholar
14.Lettieri, J., Jia, Y., Fulk, S.J., Schlom, D.G., Hawley, M.E., and Brown, G.W., Thin Solid Films 379, 64 (2000).CrossRefGoogle Scholar
15.SrTiO3 is cubic with space group Pm3m and lattice constant a = 3.905 Å at room temperature [Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology, edited by Hellwege, K-H. and Hellwege, A.M. (Springer-Verlag, Berlin, 1976), New Series, Group III, Vol. 7, Part e, pp. 134–135].Google Scholar
16.Clark, J.C., Maria, J-P., Hubbard, K.J., and Schlom, D.G., Rev. Sci. Instrum. 68, 2538 (1997).CrossRefGoogle Scholar
17.The structure of SrRuO3 belongs to the space group Pbnm and has lattice constants a 5.53 Å, b = 5.57 Å, and c = 7.85 Å at room temperature [Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology, edited by Hellwege, K-H. and Hellwege, A.M. (Springer-Verlag, Berlin, Germany, 1977), New Series, Group III, Vol. 7, Part f, p. 743.] The pseudocubic perovskite lattice (a ≈ 3.92 Å) has a –0.4% mismatch with SrTiO3 and a +0.6% mismatch with the (001) plane of SrBi2Nb2O9.Google Scholar
18.Eom, C.B., Cava, R.J., Fleming, R.M., Phillips, J.M., van Dover, R.B., Marshall, J.H., Hsu, J.W.P., Krajewski, J.J., and Peck, W.F. Jr., Science 258, 1766 (1992).CrossRefGoogle Scholar
19. SrTiO3 zone axes are used throughout this manuscript to identify the three orientations of TEM samples prepared, even though the SrTiO3 substrate is not present in every area imaged.Google Scholar
20. Two types of twins are present in these epitaxial (103) SrBi2Nb2O9 films: (1) twins that arise during growth due to the (111) SrTiO3 substrate surface and (2) twins that occur as the SrBi2Nb2O9 transforms from tetragonal to orthorhombic as it is cooled. We refer to the former as growth twins and the latter as transformation twins. To image transformation twins, i.e., see the ferroelectric domains, it is necessary to distinguish between the a and b axes of SrBi2Nb2O9. In this article we have not made any such distinction in either xray diffraction or TEM characterization, and have imaged only the three growthtwin variants.Google Scholar
21. In addition to the hkl SrBi2Nb2O9 indices given, khl SrBi2Nb2O9 indices are also implied. The latter indices are omitted for clarity, but arise because of transformation twinning. The hkl SrBi2Nb2O9 indices given are for the SrBi2Nb2O9 transformation twins having their a axis 57° out of the plane of the substrate. However, the films also contain transformation twins in which the a axis of the SrBi2Nb2O9 lies in the plane of the substrate and the b lies 57° out of the substrate plane.Google Scholar
22.Landolt-Börnstein: Numerical Data and Functional Relationships in Science and Technology, edited by Hellwege, K.H. and Hellwege, A.M. (Springer-Verlag, Berlin, 1981), New Series, Group III, Vol. 16, Part a, p. 233.Google Scholar
23.Sekiguchi, S., Fujimoto, M., Kang, M-G., Koizumi, S., Cho, S-B., and Tanaka, J., Jpn. J. Appl. Phys. 37, 4140 (1998).CrossRefGoogle Scholar
24.Sekiguchi, S., Fujimoto, M., Nomura, M., Cho, S-B., Tanaka, J., Nishihara, T., Kang, M.G., and Park, H.H., Solid State Ionics 108, 73 (1998).CrossRefGoogle Scholar
25.Sigmund, W.M., Rotov, M., Jiang, Q.D., Brunen, J., Zegenhagen, J., and Aldinger, F., Appl. Phys. A 64, 219 (1997).CrossRefGoogle Scholar
26.Ramesh, R., Hwang, D.M., Barner, J.B., Nazar, L., Ravi, T.S., Inam, A., Dutta, B., Wu, X.D., and Venkatesan, T., J. Mater. Res. 5, 704 (1990).CrossRefGoogle Scholar
27.Hesse, D., Zakharov, N.D., Pignolet, A., James, A.R., and Senz, S., Cryst. Res. Technol. 35, 641 (2000).3.0.CO;2-Z>CrossRefGoogle Scholar
28.Lettieri, J., Zurbuchen, M.A., Jia, Y., Schlom, D.G., Streiffer, S.K., and Hawley, M.E., Appl. Phys. Lett. 77, 3090 (2000).CrossRefGoogle Scholar
29.Suzuki, T., Nishi, Y., Fujimoto, M., Ishikawa, K., and Funakubo, H., Jpn. J. Appl. Phys. 38, L1261 (1999).CrossRefGoogle Scholar
30.Suzuki, T., Nishi, Y., Fujimoto, M., Ishikawa, K., and Funakubo, H., Jpn. J. Appl. Phys. 38, L1265 (1999).CrossRefGoogle Scholar
31.Zurbuchen, M.A., Lettieri, J., Streiffer, S.K., Jia, Y., Hawley, M.E., Pan, X.Q., Carim, A.H., and Schlom, D.G., Integrated Ferroelectrics (in press).Google Scholar
32.Zurbuchen, M.A., Lettieri, J., Jia, Y., Streiffer, S.K., and Schlom, D.G., Appl. Phys. Lett. (in preparation).Google Scholar
33.Lee, H.N., Visinoiu, A., Senz, S., Harnagea, C., Pignolet, A., Hesse, D., and Gösele, U., J. Appl. Phys. 88, 6658 (2000).CrossRefGoogle Scholar