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The yield stress of polycrystalline thin films

Published online by Cambridge University Press:  31 January 2011

C.V. Thompson
C.V. Thompson
Affiliation:
Department of Materials Science and Engineering, Massachusetts Institute of Technology, Cambridge, Massachusetts 02139
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Abstract

In recent experiments it has been shown that the yield stress of polycrystalline thin films depends separately on the film thickness and the grain size. It was also shown that the grain size dependence varies as the reciprocal of the grain size. In this paper an analysis is presented which leads to these results and provides a more detailed understanding of the origins of the observed behavior.

Type
Communications
Information
Journal of Materials Research , Volume 8 , Issue 2 , February 1993 , pp. 237 - 238
Copyright
Copyright © Materials Research Society 1993

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References

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