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Evaluation and simulations of a Thomson scattering X-ray source based on ray tracing methods

Published online by Cambridge University Press:  01 July 2004

BING XIA ,
ZHENG LI ,
KEJUN KANG ,
WENHUI HUANG ,
GANG HUANG ,
XIAOZHONG HE ,
YINGCHAO DU  and
CHUANXIANG TANG
BING XIA
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
ZHENG LI
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
KEJUN KANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
WENHUI HUANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
GANG HUANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
XIAOZHONG HE
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
YINGCHAO DU
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
CHUANXIANG TANG
Affiliation:
Department of Engineering Physics, Tsinghua University, Beijing, P. R. China
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Abstract

We propose to build up a facility of sub-picosecond hard X-ray pulses based on Thomson scattering between femtosecond laser pulses and relativistic electrons which is a useful tool for the purpose of material investigation, plasma diagnostics, and shock wave measurement. This article reviews the principles and the development of X-ray sources based on Thomson scattering. Then New Light Source®, the Thomson scattering X-ray facility we will develop is introduced. The characteristics of a Thomson scattering X-ray source are analyzed. A computer model of the Thomson source to be developed is described in order to provide a source of the rays used in a ray tracing method, which has proved to be an essential computer tool for designing and optimizing the optical system of high brightness X-ray facilities. A code for the ray tracing source model is created based on the Monte Carlo approach. It is able to evaluate the properties and performances of the light source under development using this model. According to the simulation results, we discuss the dependence of imaging quality and source properties including spectral distribution, emittance, flux which depends on the laser and electron beam parameters, in order to check if operation performances are as expected. We also estimate the possibility of measuring the energy spectrum of a Thomson scattering source by using a crystal diffraction method. Ray tracing calculations are performed using SHADOW program package, and a new model of Thomson scattering X-ray source which can be processed in that program is established with additional code.

Keywords

Crystal spectroscopyRay tracingThomson scattering
Type
Research Article
Information
Laser and Particle Beams , Volume 22 , Issue 3 , July 2004 , pp. 355 - 365
Copyright
© 2004 Cambridge University Press

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