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3D Full-field Transmission X-ray Microscopy Based on Equally Sloped Tomography at Shanghai Synchrotron Radiation Facility

Published online by Cambridge University Press:  10 August 2018

Yuqi Ren ,
Yudan Wang ,
Guangzhao Zhou ,
Guohao Du ,
Biao Deng ,
Honglan Xie  and
Tiqiao Xiao
Yuqi Ren
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China.
Yudan Wang
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China.
Guangzhao Zhou
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China.
Guohao Du
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China.
Biao Deng*
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China. University of Chinese Academy of Sciences, No. 19A Yuquanlu, Beijing, 100049, China.
Honglan Xie
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China. University of Chinese Academy of Sciences, No. 19A Yuquanlu, Beijing, 100049, China.
Tiqiao Xiao
Affiliation:
Shanghai Institute of Applied Physics, Chinese Academy of Sciences, 239 Zhangheng Road, Shanghai, 201204, China. University of Chinese Academy of Sciences, No. 19A Yuquanlu, Beijing, 100049, China.
*
*Corresponding author, email_dengbiao@sinap.ac.cn

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 24 , Supplement S2: Proceedings of the 14th International Conference on X-ray Microscopy (XRM2018) , August 2018 , pp. 206 - 207
Copyright
© Microscopy Society of America 2018 

References

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[5] Ren, Y., Wang, Y., et al, J. X-ray Sci. Technol. 24 2016 79.Google Scholar