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3D Imaging with Single Atom Sensitivity using Confocal STEM

Published online by Cambridge University Press:  31 July 2006

K van Benthem ,
N de Jonge ,
AY Borisevich ,
MP Oxley  and
SJ Pennycook
K van Benthem
Affiliation:
Oak Ridge National Laboratory
N de Jonge
Affiliation:
Oak Ridge National Laboratory
AY Borisevich
Affiliation:
Oak Ridge National Laboratory
MP Oxley
Affiliation:
Oak Ridge National Laboratory
SJ Pennycook
Affiliation:
Oak Ridge National Laboratory

Extract

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Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Abstract
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 1562 - 1563
Copyright
© 2006 Microscopy Society of America