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4-D STEM Analyses of Cylindrical Specimens for Atom Probe Tomography

Published online by Cambridge University Press:  30 July 2021

Brian Gorman ,
Megan Holtz ,
Christopher J. K. Richardson ,
Chomani Gaspe ,
Edwin Supple  and
Robert Butera
Brian Gorman
Affiliation:
Colorado School of Mines, United States
Megan Holtz
Affiliation:
Colorado School of Mines, United States
Christopher J. K. Richardson
Affiliation:
Laboratory for Physical Sciences, United States
Chomani Gaspe
Affiliation:
Laboratory for Physical Science, United States
Edwin Supple
Affiliation:
Colorado School of Mines, United States
Robert Butera
Affiliation:
Laboratory for Physical Science, United States

Abstract

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Type
Advanced Application of Atom Probe Tomography: Specimen preparation, Instrumentation, and Data analysis
Information
Microscopy and Microanalysis , Volume 27 , Supplement S1 , August 2021 , pp. 184 - 186
Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

References

Ceguerra, A., Breen, A., Cairney, J., Ringer, S. & Gorman, B. (2021). Integrative Atom Probe Tomography using STEM-Centric Atom Placement as a Step Towards Atomic-Scale Tomography. MICROSCOPY AND MICROANALYSIS 27, 140–148.CrossRefGoogle Scholar
Kelly, T. F., Gorman, B. P. & Ringer, S. P. (2021). Atomic Scale Analytical Tomography. Cambridge University Press.Google Scholar
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Padgett, E., Holtz, M. E., Cueva, P., Shao, Y.-T., Langenberg, E., Schlom, D. G. & Muller, D. A. (2020). The exit-wave power-cepstrum transform for scanning nanobeam electron diffraction: robust strain mapping at subnanometer resolution and subpicometer precision. Ultramicroscopy 214, 112994.CrossRefGoogle ScholarPubMed
This work was funded by the Laboratory for Physical Science under contract #H98230-19-C-0428Google Scholar