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Aberration-Corrected STEM - More than just Higher Resolution

Published online by Cambridge University Press:  31 July 2006

S Pennycook ,
M Chisholm ,
A Lupini ,
Y Peng ,
M Varela ,
K van Benthem ,
A Borisevich ,
N de Jonge  and
M Oxley
S Pennycook
Affiliation:
Oak Ridge National Laboratory
M Chisholm
Affiliation:
Oak Ridge National Laboratory
A Lupini
Affiliation:
Oak Ridge National Laboratory
Y Peng
Affiliation:
Oak Ridge National Laboratory
M Varela
Affiliation:
Oak Ridge National Laboratory
K van Benthem
Affiliation:
Oak Ridge National Laboratory
A Borisevich
Affiliation:
Oak Ridge National Laboratory
N de Jonge
Affiliation:
Oak Ridge National Laboratory
M Oxley
Affiliation:
Oak Ridge National Laboratory
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Extract

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2005

Type
Research Article
Information
Microscopy and Microanalysis , Volume 12 , Issue S02 , August 2006 , pp. 132 - 133
Copyright
© 2006 Microscopy Society of America

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