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Antibody-Mediated Self-Limiting Self-Assembly for Quantitative Analysis of Nanoparticle Surfaces by Atomic Force Microscopy

Published online by Cambridge University Press:  03 March 2011

Carly Lay A. Geronimo  and
Robert I. MacCuspie
Carly Lay A. Geronimo
Affiliation:
Nanomechanical Properties Group, National Institute of Standards and Technology, Gaithersburg, MD, USA
Robert I. MacCuspie*
Affiliation:
Nanomechanical Properties Group, National Institute of Standards and Technology, Gaithersburg, MD, USA
*
Corresponding author. E-mail: robert.maccuspie@nist.gov
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Abstract

Quantification of very low density molecular coatings on large (60 nm) gold nanoparticles (AuNPs) is demonstrated via the use of antibody-mediated self-limiting self-assembly of small and large AuNPs into raspberry-like structures subsequently imaged by atomic force microscopy (AFM). AFM imaging is proposed as an automated, lower-cost, higher-throughput alternative to immunostaining and imaging by transmission electron microscopy. Synthesis of large AuNPs, containing one of three ligand molecules in one of three stoichiometries (1, 2, or 10 ligands per AuNP), and small probe AuNPs with one of three antibody molecules in a one antibody per AuNP ratio, enabled a range of predicted self-limiting self-assembled structures. A model predicting the probability of observing a given small to large AuNP ratio based on a topography measurement such as AFM is described, in which random orientational deposition is assumed and which accounts for the stochastic synthesis method of the library AuNPs with varied ligand ratios. Experimental data were found to agree very well with the predictive models when using an established AFM sample preparation method that avoids drying-induced aggregation.

Keywords

self-limiting self-assemblynanoparticle surface characterizationimmunostainingatomic force microscopy (AFM)transmission electron microscopy (TEM)
Type
Biological Applications
Information
Microscopy and Microanalysis , Volume 17 , Issue 2 , April 2011 , pp. 206 - 214
Copyright
Copyright © Microscopy Society of America 2011

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Footnotes

NIST Disclaimer: Certain trade names and company products are mentioned in the text or identified in illustrations in order to specify adequately the experimental procedure and equipment used. In no case does such identification imply recommendation or endorsement by National Institute of Standards and Technology, nor does it imply that the products are necessarily the best available for the purpose.

References

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