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Characterization of Inertial Confinement Fusion (ICF) Targets Using PIXE, RBS, and STIM Analysis

Published online by Cambridge University Press:  23 May 2013

Yongqiang Li ,
Xue Liu ,
Xinyi Li ,
Yiyang Liu ,
Yi Zheng ,
Min Wang  and
Hao Shen
Yongqiang Li
Affiliation:
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China
Xue Liu
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621900, China
Xinyi Li
Affiliation:
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China
Yiyang Liu
Affiliation:
Research Center of Laser Fusion, CAEP, Mianyang 621900, China
Yi Zheng
Affiliation:
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China
Min Wang
Affiliation:
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China
Hao Shen*
Affiliation:
Applied Ion Beam Physics Laboratory, Institute of Modern Physics, Fudan University, Shanghai 200433, China
*
*Corresponding author. E-mail: haoshen@fudan.edu.cn
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Abstract

Quality control of the inertial confinement fusion (ICF) target in the laser fusion program is vital to ensure that energy deposition from the lasers results in uniform compression and minimization of Rayleigh–Taylor instabilities. The technique of nuclear microscopy with ion beam analysis is a powerful method to provide characterization of ICF targets. Distribution of elements, depth profile, and density image of ICF targets can be identified by particle-induced X-ray emission, Rutherford backscattering spectrometry, and scanning transmission ion microscopy. We present examples of ICF target characterization by nuclear microscopy at Fudan University in order to demonstrate their potential impact in assessing target fabrication processes.

Keywords

ICF targetPIXERBSSTIM
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 19 , Issue 4 , August 2013 , pp. 1073 - 1079
Copyright
Copyright © Microscopy Society of America 2013 

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