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Correlative Fractography: Combining Scanning Electron Microscopy and Light Microscopes for Qualitative and Quantitative Analysis of Fracture Surfaces

Published online by Cambridge University Press:  12 February 2013

Luis Rogerio de Oliveira Hein ,
José Alberto de Oliveira  and
Kamila Amato de Campos
Luis Rogerio de Oliveira Hein*
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
José Alberto de Oliveira
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
Kamila Amato de Campos
Affiliation:
UNESP—Univ Estadual Paulista, DMT—Department of Materials and Technology, LAIMat—Materials Imaging Laboratory, Av. Ariberto Pereira da Cunha, 333, Guaratinguetá, SP, 12.516-410, Brazil
*
*Corresponding author. E-mail: rhein@feg.unesp.br
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Abstract

Correlative fractography is a new expression proposed here to describe a new method for the association between scanning electron microscopy (SEM) and light microscopy (LM) for the qualitative and quantitative analysis of fracture surfaces. This article presents a new method involving the fusion of one elevation map obtained by extended depth from focus reconstruction from LM with exactly the same area by SEM and associated techniques, as X-ray mapping. The true topographic information is perfectly associated to local fracture mechanisms with this new technique, presented here as an alternative to stereo-pair reconstruction for the investigation of fractured components. The great advantage of this technique resides in the possibility of combining any imaging methods associated with LM and SEM for the same observed field from fracture surface.

Keywords

quantitative fractographylight microscopyscanning electron microscopyimage processingextended depth from focus reconstructioncorrelative microscopy
Type
Software, Techniques, and Equipment Development: Short Communications
Information
Microscopy and Microanalysis , Volume 19 , Issue 2 , April 2013 , pp. 496 - 500
Copyright
Copyright © Microscopy Society of America 2013

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