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Electron Holographic Visualization of Collective Motion of Electrons Through Electric Field Variation

Published online by Cambridge University Press:  12 May 2014

Daisuke Shindo ,
Shinji Aizawa ,
Zentaro Akase ,
Toshiaki Tanigaki ,
Yasukazu Murakami  and
Hyun Soon Park
Daisuke Shindo*
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
Shinji Aizawa
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
Zentaro Akase
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
Toshiaki Tanigaki
Affiliation:
RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
Yasukazu Murakami
Affiliation:
Institute of Multidisciplinary Research for Advanced Materials, Tohoku University, Sendai 980-8577, Japan RIKEN Center for Emergent Matter Science (CEMS), Wako 351-0198, Japan
Hyun Soon Park
Affiliation:
Department of Materials Science & Engineering, Dong-A University, Busan 604-714, Korea
*
*Corresponding author. shindo@tagen.tohoku.ac.jp
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Abstract

This study demonstrates the accumulation of electron-induced secondary electrons by utilizing a simple geometrical configuration of two branches of a charged insulating biomaterial. The collective motion of these secondary electrons between the branches has been visualized by analyzing the reconstructed amplitude images obtained using in situ electron holography. In order to understand the collective motion of secondary electrons, the trajectories of these electrons around the branches have also been simulated by taking into account the electric field around the charged branches on the basis of Maxwell’s equations.

Keywords

electron holographychargingsecondary electronelectric field
Type
FEMMS Special Issue
Information
Microscopy and Microanalysis , Volume 20 , Issue 4 , August 2014 , pp. 1015 - 1021
Copyright
© Microscopy Society of America 2014 

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References

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