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Evaluation of Controlled-Drift Detectors in X-Ray Spectroscopic Imaging Applications

Published online by Cambridge University Press:  22 May 2009

Andrea Castoldi ,
Chiara Guazzoni ,
Cigdem Ozkan ,
Giorgio Vedani ,
Robert Hartmann  and
Aniouar Bjeoumikhov
Andrea Castoldi*
Affiliation:
Politecnico di Milano, Dip. Elettronica e Informazione, P.za Leonardo da Vinci 32, 20133 Milano, Italy INFN, Sezione di Milano, Via Celoria 16, 20133 Milano, Italy
Chiara Guazzoni
Affiliation:
Politecnico di Milano, Dip. Elettronica e Informazione, P.za Leonardo da Vinci 32, 20133 Milano, Italy INFN, Sezione di Milano, Via Celoria 16, 20133 Milano, Italy
Cigdem Ozkan
Affiliation:
Politecnico di Milano, Dip. Elettronica e Informazione, P.za Leonardo da Vinci 32, 20133 Milano, Italy INFN, Sezione di Milano, Via Celoria 16, 20133 Milano, Italy Universita' degli Studi di Milano, Dip. di Fisica, Via Celoria 16, 20133 Milano, Italy
Giorgio Vedani
Affiliation:
Politecnico di Milano, Dip. Elettronica e Informazione, P.za Leonardo da Vinci 32, 20133 Milano, Italy
Robert Hartmann
Affiliation:
PNSensor GmbH, Römerstrasse 28, 80803 München, Germany MPI-Halbleiterlabor, Otto-Hahn-Ring 6, 81739 München, Germany
Aniouar Bjeoumikhov
Affiliation:
IFG GmbH, Berlin, Germany
*
Corresponding author. E-mail: andrea.castoldi@polimi.it
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Abstract

A detector that looks promising for advanced imaging modalities—such as X-ray absorption contrast imaging, X-ray fluorescence imaging, and diffraction-enhanced imaging—is the controlled-drift detector (CDD). The CDD is a novel two-dimensional X-ray imager with energy resolving capability of spectroscopic quality. It is built on a fully depleted silicon wafer and features fast readout while being operated at or near room temperature. The use of CDDs in the aforementioned applications allows translating these techniques from synchrotron-based experiments to laboratory-size experiments using polychromatic X-ray generators. We have built a dedicated and versatile detection module based on a 36 mm2 CDD chip featuring pixels of 180 × 180 μm2, and we evaluated the system performance in different X-ray imaging applications both with synchrotron-based experiments and in the laboratory environment.

Keywords

controlled-drift detectorssilicon drift detectorsX-ray imagingX-ray spectroscopyXRFabsorption contrastdiffraction enhanced imagingelemental mapping.
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 15 , Issue 3 , June 2009 , pp. 231 - 236
Copyright
Copyright © Microscopy Society of America 2009

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