Hostname: page-component-78c5997874-lj6df Total loading time: 0 Render date: 2024-11-10T14:55:56.821Z Has data issue: false hasContentIssue false
  • English
  • Français

Image Analysis—Turning Images Into Data

Published online by Cambridge University Press:  02 July 2020

J. J. Friel  and
E. B. Prestridge
J. J. Friel
Affiliation:
Princeton Gamma-Tech, C/N 863., Princeton, NJ 08542-0863
E. B. Prestridge
Affiliation:
Princeton Gamma-Tech, C/N 863., Princeton, NJ 08542-0863
Get access

Extract

Image analysis is the process of quantifying some aspect of an image—its particle size distribution, for example. Manual methods were in use long before computers made image analysis much faster and more reproducible. Linear measurements of diameter, point counting to measure volume fraction, and intercept counting to determine grain size have been used for over 100 years. Automatic image analysis (AIA), however, can make more measurements, and even calculate derived measurements, such as aspect ratio or circularity. AIA of a specimen or micrograph, of course, is only as good as the contrast mechanism used, so the imaging signal must be chosen carefully to reveal to the computer what is to be measured. Obtaining sufficient contrast is often the limiting task.

Once an imaging signal is chosen and the digital resolution set, the computer can analyze the image. The feature descriptors can be generic:

Type
Applied Image Processing: What it Can do for Digital Imaging
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 58 - 59
Copyright
Copyright © Microscopy Society of America

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. E 112, Annual Book of Standards, Philadelphia, ASTMGoogle Scholar
2.Vander Voort, G. F., in Vander Voort, G. F., Ed., Micon 90 Advances in Video Technology for Microstructural Control, Philadelphia, ASTM (1991) 242.CrossRefGoogle Scholar
3.Schwarz, H. and Exner, H. E., J. Microscopy, 129, (1983) 155.CrossRefGoogle Scholar