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In Situ Real-time Environmental High Resolution Electron Microscopy of Nanometer Size Novel Xerogel Catalysts for Hydrogenation Reactions in Nylon 6,6

Published online by Cambridge University Press:  07 August 2002

Pratibha L. Gai ,
Kostantinos Kourtakis  and
Stanislav Ziemecki
Pratibha L. Gai*
Affiliation:
Central Research and Development, DuPont Science and Engineering Laboratories, Experimental Station, Wilmington, DE 19880-0356 Department of Materials Science and Engineering, University of Delaware, Newark, DE 19716
Kostantinos Kourtakis
Affiliation:
Central Research and Development, DuPont Science and Engineering Laboratories, Experimental Station, Wilmington, DE 19880-0356
Stanislav Ziemecki
Affiliation:
Central Research and Development, DuPont Science and Engineering Laboratories, Experimental Station, Wilmington, DE 19880-0356
*
*Corresponding author
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Abstract

In situ real-time environmental high resolution electron microscopy (EHREM) under controlled reaction environments permits direct atomic resolution imaging of dynamic surface and sub-surface microstructures of reacting catalysts. Using the EHREM and complementary microscopy methods, we have investigated selective hydrogenation reaction mechanisms over novel xerogel catalysts of ruthenium and Ru with Co and Au promoters on titania supports, and report an alternative heterogeneous catalytic process for the hydrogenation of adiponitrile (ADN) in the manufacture of Nylon 6,6. The direct EHREM observations are supported by ultra-high resolution low voltage scanning electron microscope (SEM) of spatial distributions of the highly dispersed nanometer-size catalyst particles and parallel chemical studies. The results demonstrate the important role of in situ EHREM in the design of heterogeneous catalytic hydrogenation processes on the nanoscale.

Keywords

in situ real-time environmental high resolution electron microscopyatomic resolutionscanning electron microscopyadiponitrile hydrogenationpolymerizationnylon
Type
Research Article
Information
Microscopy and Microanalysis , Volume 6 , Issue 4 , July 2000 , pp. 335 - 342
Copyright
Copyright © Microscopy Society of America 2000

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