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Probing the Chemical Structure in Diamond-Based Materials Using Combined Low-Loss and Core-Loss Electron Energy-Loss spectroscopy

Published online by Cambridge University Press:  25 March 2014

Paolo Longo ,
Ray D. Twesten  and
Jaco Olivier
Paolo Longo*
Affiliation:
Gatan Inc., 5794, W Las Positas BLVD, Pleasanton, CA 94588, USA
Ray D. Twesten
Affiliation:
Gatan Inc., 5794, W Las Positas BLVD, Pleasanton, CA 94588, USA
Jaco Olivier
Affiliation:
Centre for HRTEM, South Campus, Nelson Mandela Metropolitan University, Port Elizabeth, 6031, South Africa
*
*Corresponding author.plongo@gatan.com
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Abstract

We report the analysis of the changes in local carbon structure and chemistry caused by the self-implantation of carbon into diamond via electron energy-loss spectroscopy (EELS) plasmon energy shifts and core-edge fine structure fingerprinting. These two very different EELS energy and intensity ranges of the spectrum can be acquired under identical experimental conditions and nearly simultaneously using specially designed deflectors and energy offset devices known as “DualEELS.” In this way, it is possible to take full advantage of the unique and complementary information that is present in the low- and core-loss regions of the EELS spectrum. We find that self-implanted carbon under the implantation conditions used for the material investigated in this paper creates an amorphous region with significant sp2 content that varies across the interface.

Keywords

diamondSTEMEELScarbonSIimplantationchemistry
Type
EDGE Special Issue
Information
Microscopy and Microanalysis , Volume 20 , Issue 3 , June 2014 , pp. 779 - 783
Copyright
© Microscopy Society of America 2014 

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