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Production Microscopy: A New Paradigm

Published online by Cambridge University Press:  02 July 2020

Richard J. Lee
Richard J. Lee*
Affiliation:
RJ Lee Group, Inc., Monroeville, Pa, 15146
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Extract

During the past twelve months RJ Lee Group has manually collected and published over one hundred thousand composite SEM images consisting of three components: a low magnification image, a high magnification image, and an x-ray spectrum. In addition, about one and one-half million discrete features have been automatically located and compositionally/morphologically characterized, with about one-fourth of those features then having ancillary images collected automatically based upon characterization criteria. Finally between ten and twenty thousand images have been collected for the production of image montages. The output of this effort has been systematically entered into networked databases where it is accessed for post-processing, analysis, and report generation.

Type
Microscopy and Microanalysis in the “Real World”
Information
Microscopy and Microanalysis , Volume 4 , Issue S2: Proceedings: Microscopy & Microanalysis '98, Microscopy Society of America 56th Annual Meeting, Microbeam Analysis Society 32nd Annual Meeting, Atlanta, Georgia July 12-16, 1998 , July 1998 , pp. 482 - 483
Copyright
Copyright © Microscopy Society of America

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References

1 This paper will review examples of the facilities developed or adapted by RJ Lee Group. Inc. to effectively acquire, manage, and utilize the information produced using the enabling technologies of "Production Microscopy" and will project the impact of this new paradigm on the types of problems which have now become amenable to SEM analysis.Google Scholar