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Single- and Multi-Frequency Detection of Surface Displacements via Scanning Probe Microscopy

Published online by Cambridge University Press:  02 January 2015

Konstantin Romanyuk ,
Sergey Yu. Luchkin Open the ORCID record for Sergey Yu. Luchkin [Opens in a new window] ,
Maxim Ivanov ,
Arseny Kalinin  and
Andrei L. Kholkin
Konstantin Romanyuk
Affiliation:
Department of Materials and Ceramic Engineering & CICECO, University of Aveiro, 3810-193 Aveiro, Portugal Rzhanov Institute of Semiconductor Physics, Lavrentieva 13, Novosibirsk 630090, Russia
Sergey Yu. Luchkin
Affiliation:
Department of Materials and Ceramic Engineering & CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
Maxim Ivanov
Affiliation:
Department of Materials and Ceramic Engineering & CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
Arseny Kalinin
Affiliation:
NT-MDT Co., Post Box 158, Building 317-А, Zelenograd, Moscow 124482, Russia
Andrei L. Kholkin*
Affiliation:
Department of Materials and Ceramic Engineering & CICECO, University of Aveiro, 3810-193 Aveiro, Portugal
*
*Corresponding author. kholkin@ua.pt
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Abstract

Piezoresponse force microscopy (PFM) provides a novel opportunity to detect picometer-level displacements induced by an electric field applied through a conducting tip of an atomic force microscope (AFM). Recently, it was discovered that superb vertical sensitivity provided by PFM is high enough to monitor electric-field-induced ionic displacements in solids, the technique being referred to as electrochemical strain microscopy (ESM). ESM has been implemented only in multi-frequency detection modes such as dual AC resonance tracking (DART) and band excitation, where the response is recorded within a finite frequency range, typically around the first contact resonance. In this paper, we analyze and compare signal-to-noise ratios of the conventional single-frequency method with multi-frequency regimes of measuring surface displacements. Single-frequency detection ESM is demonstrated using a commercial AFM.

Keywords

piezoresponse force microscopyelectrochemical strain microscopyband excitationmulti-frequency detectionsignal-to-noise ratioresonance amplification
Type
Materials Applications
Information
Microscopy and Microanalysis , Volume 21 , Issue 1 , February 2015 , pp. 154 - 163
Copyright
© Microscopy Society of America 2014 

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