abTEM: ab Initio Transmission Electron Microscopy Image Simulation

Jacob Madsen; Toma Susi

doi:10.1017/S1431927620014701

Abstract

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References

Kirkland, E.J., Advanced Computing in Electron Microscopy, 2^nd edition, Springer USGoogle Scholar

Kurasch, S., Beilstein Journal of Nanotechnology 2 (2011) 39410.3762/bjnano.2.45CrossRef Google Scholar

Ophus, C., Microscopy and Microanalysis 25 (2017) 56310.1017/S1431927619000497CrossRef Google Scholar

Susi, T. et al. , Ultramicroscopy 197 (2019) 1610.1016/j.ultramic.2018.11.002CrossRef Google Scholar

Larsen, A.H. et al. , Journal of Physics: Condensed Matter 29 (2017) 273002Google Scholar

Mortensen, J.J. et al. , Physical Review B 71 (2005) 03510910.1103/PhysRevB.71.035109CrossRef Google Scholar

Larsen, A.H. et al. , Modelling and Simulation in Matererials Science and Engineering 25 (2017) 06500410.1088/1361-651X/aa7320CrossRef Google Scholar

Lobato, I. and van Dyck, D., Ultramicroscopy 156 (2015) 910.1016/j.ultramic.2015.04.016CrossRef Google Scholar

Ophus, C., Advanced Structural and Chemical Imaging 3 (2017) 1310.1186/s40679-017-0046-1CrossRef Google Scholar

Yankowitz, M. et al. , Science 363 (2018) 105910.1126/science.aav1910CrossRef Google Scholar

The work was supported by the European Research Council (ERC) Grant No. 756277-ATMEN.Google Scholar

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abTEM: ab Initio Transmission Electron Microscopy Image Simulation

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