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Gerencia Materiales - CNEA e Instituto Sabato (UNSAM), San Martín, Buenos Aires, ArgentinaUniversidad Tecnológica Nacional, Facultad Regional Pacheco (UTN-FRGP), Pacheco, Bs. As., ArgentinaConsejo Nacional de Investigaciones Científicas y Técnicas (CONICET), Godoy Cruz 2290, CABA, Argentina
E. Zelaya
Affiliation:
División Física de Metales - CNEA e Instituto Balseiro (UNCuyo), Av. Bustillo km 9.5, 8400S.C. de Bariloche, Argentina
P.B. Bozzano
Affiliation:
Gerencia Materiales - CNEA e Instituto Sabato (UNSAM), San Martín, Buenos Aires, Argentina
G.H. Rubiolo
Affiliation:
Gerencia Materiales - CNEA e Instituto Sabato (UNSAM), San Martín, Buenos Aires, ArgentinaUniversidad Tecnológica Nacional, Facultad Regional Pacheco (UTN-FRGP), Pacheco, Bs. As., Argentina
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[1]Williams, D.B. and Carter, C.B. in “Transmission Electron Microscopy. A Textbook for Materials Science”, (Springer Science + Business Media, LLC, 233 Spring Street, New York, NY 10013, USA, 2009) pp. 639-660.10.1007/978-0-387-76501-3_35CrossRefGoogle Scholar
[2]
[2]This work was performed in the Gerencia Materiales, CAC – CNEA, and partially founded by the ANPCyT through grant PICT-2015-2267, and by the Universidad Nacional de San Martín through the grant C079 (2017-2019)Google Scholar