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Accurate Recording and Measurement of Electron Diffraction Data in Structural and Difference Fourier Studies of Proteins

Published online by Cambridge University Press:  02 February 2002

Kenneth H. Downing*
Affiliation:
Donner Laboratory, Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
Huilin Li
Affiliation:
Donner Laboratory, Life Sciences Division, Lawrence Berkeley National Laboratory, Berkeley, CA 94720
*
*Corresponding author
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Abstract

Many of the techniques that have been developed in X-ray crystallography are being applied in electron crystallographic studies of proteins. Electron crystallography has the advantage of measuring structure factor phases directly from high resolution images with an accuracy substantially higher than is common in X-ray crystallography. However, electron diffraction amplitudes are often not as precise as those obtained in X-ray work. We discuss here some approaches to maximizing the reliability of the diffraction amplitudes through choice of exposure and data processing schemes. With accurate measurement of diffraction data, Fourier difference methods can be used in electron crystallographic studies of small, localized changes of proteins that exist in two-dimensional crystals. The mathematical basis for the power of these methods in detecting small changes is reviewed. We then discuss several issues related to optimizing the quality of the diffraction data and derive an expression for the best exposure for recording diffraction patterns. An application of Fourier difference maps in localizing drug binding sites on the protein tubulin is discussed.

Type
Research Article
Copyright
Copyright © Microscopy Society of America 2001

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