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Acquisition and Analysis of Serial Electron Diffraction Data for Structure Determination

Published online by Cambridge University Press:  22 July 2022

Asma Sarguroh ,
Ehsan Nikbin ,
Jessica E. Besaw ,
Hazem Daoud ,
Robert A. McLeod ,
Jane Y. Howe ,
Oliver P. Ernst  and
R. J. Dwayne Miller
Asma Sarguroh
Affiliation:
Department of Chemistry, University of Glasgow, Glasgow, Scotland, U.K Department of Chemistry, University of Toronto, Toronto, ON, Canada
Ehsan Nikbin
Affiliation:
Department of Material Science and Engineering, University of Toronto, Toronto, ON, Canada
Jessica E. Besaw
Affiliation:
Department of Biochemistry, University of Toronto, Toronto, ON, Canada
Hazem Daoud
Affiliation:
Department of Physics, University of Toronto, Toronto, ON, Canada
Robert A. McLeod
Affiliation:
Hitachi High-Tech Canada Inc., Toronto, ON, Canada
Jane Y. Howe
Affiliation:
Department of Material Science and Engineering, University of Toronto, Toronto, ON, Canada Department of Chemical Engineering & Applied Chemistry, University of Toronto, Toronto, ON, Canada
Oliver P. Ernst
Affiliation:
Department of Biochemistry, University of Toronto, Toronto, ON, Canada
R. J. Dwayne Miller
Affiliation:
Department of Chemistry, University of Toronto, Toronto, ON, Canada Department of Physics, University of Toronto, Toronto, ON, Canada

Abstract

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Type
Developments of 4D-STEM Imaging - Enabling New Materials Applications
Information
Microscopy and Microanalysis , Volume 28 , Supplement S1 , August 2022 , pp. 356 - 358
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Copyright
Copyright © Microscopy Society of America 2022

References

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Bücker, R., Hogan-Lamarre, P., and Miller, D. R. J. (2021). Front. Mol. Biosci. 8, 415.CrossRefGoogle Scholar
Klinger, M. (2017). J. Appl. Cryst. 50, 1226-1234.CrossRefGoogle Scholar
We thank the support by the National Sciences and Engineering Research Council (NSERC) of Canada, as well as the use of the Open Centre for the Characterization of Advanced Materials (OCCAM). AS and EN have contributed equally to this work.Google Scholar