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Adaptive Phenotypic Plasticity of Siberian Elm in Response to Drought Stress: Increased Stomatal Pore Depth

Published online by Cambridge University Press:  06 August 2013

Go Eun Park ,
Ki Woo Kim ,
Don Koo Lee  and
Jung Oh Hyun
Go Eun Park
Affiliation:
Department of Forest Sciences, Seoul National University, Seoul 151-921, Korea
Ki Woo Kim*
Affiliation:
School of Ecology and Environmental System, Kyungpook National University, Sangju 741-711, Korea
Don Koo Lee*
Affiliation:
Department of Forest Sciences, Seoul National University, Seoul 151-921, Korea
Jung Oh Hyun*
Affiliation:
Department of Forest Sciences, Institute of Future Environmental and Forest Resources, Seoul National University, Seoul 151-921, Korea
*
†Corresponding author. E-mail: kiwoo@knu.ac.kr
‡Corresponding author. E-mail: leedk@snu.ac.kr
§Corresponding author. E-mail: junghyun@snu.ac.kr
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Abstract

Leaf stomatal characteristics of Siberian elm (Ulmus pumila) were investigated by electron microscopy and white light scanning interferometry. On the basis of average annual precipitations, two types of tree specimens were collected from Korea, China, and Mongolia: (1) trees under normal environmental conditions and (2) trees under arid conditions. Field emission scanning electron microscopy revealed oval-shaped stomata on the lower surface, and they were ca. 20 μm in width. In-lens secondary electron imaging showed differences in electron density and stomatal pore depth between the two types. According to the line profile analysis by white light scanning interferometry, stomata under arid conditions appeared to have higher levels of the stomatal pore depth than ones under normal conditions. Focused ion beam–field emission electron microscopy supported the increased stomatal pore depth with the increasing drought stress gradient. These results suggest that complementary microscopy can be employed to unravel the adaptive phenotypic plasticity of Siberian elm in response to drought stress.

Keywords

droughtFIBinterferometrystomataUlmus pumila
Type
Research Article
Information
Microscopy and Microanalysis , Volume 19 , Supplement S5: IUMAS , August 2013 , pp. 178 - 181
Copyright
Copyright © Microscopy Society of America 2013 

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