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An Atomic Renaissance For Pulsed Field Ion Microscopy

Published online by Cambridge University Press:  05 August 2019

Shyam Katnagallu ,
Isabelle Mouton ,
Felipe Oliveira ,
Baptiste Gault ,
Dierk Raabe  and
Leigh T. Stephenson
Shyam Katnagallu
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
Isabelle Mouton
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
Felipe Oliveira
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
Baptiste Gault
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
Dierk Raabe
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
Leigh T. Stephenson*
Affiliation:
Max Planck Institute für Eisenforschung, Düsseldorf, Germany
*
*Corresponding author: l.stephenson@mpie.de

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 304 - 305
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Müller, EW, Panitz, JA, McLane, SB, “The Atom-Probe Field Ion Microscope”, Review of Scientific Instruments 39 (1968) p. 83.Google Scholar
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[3]S Koelling et al. , “Direct imaging of 3D atomic-scale dopant-defect clustering processes in ion-implanted silicon”, Nano Letters 13 (2013) p. 2458.Google Scholar
[4]Seidman, DN, “Three-Dimensional Atom-Probe Tomography: Advances and Applications”, Annual Review of Materials Research 37 (2007) 127–158Google Scholar
[5]Åtomnaut, http://www.atomnaut.com/ (accessed February 14, 2019).Google Scholar
[6]Gault, B, Moody, MP, Cairney, JM, Ringer, SP, “Atom Probe Microscopy”, Springer New York (2012)Google Scholar