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Analysis on Determination of Correct Solutions in Orientation Imaging Microscopy

Published online by Cambridge University Press:  28 April 2020

N. S. De Vincentis  and
D. P. Field
N. S. De Vincentis*
Affiliation:
Instituto de Física Rosario, FCEIA-UNR-CONICET, Bv. 27 de Febrero 210 bis, S2000EZP Rosario, Argentina
D. P. Field
Affiliation:
Voiland College of Engineering and Architecture, Washington State University, 305 NE Spokane St., 99163 Pullman, WA, USA
*
*Corresponding author: devincentis@ifir-conicet.gov.ar

Abstract

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Type
Abstract
Information
Microscopy and Microanalysis , Volume 26 , Supplement S1: Proceedings of 15th Interamerican Microscopy Congress CIASEM - SAMIC , March 2020 , pp. 15 - 16
Copyright
Copyright © Microscopy Society of America 2020

References

References:

[1]Schwartz, A.J., Kumar, M., Adams, B.L., Field, D.P., Electron Backscatter Diffraction in Materials Science, 2nd ed.Kluwer Academic-Plenum Publishers, New York (2000).10.1007/978-1-4757-3205-4CrossRefGoogle Scholar
[2]Wright, S.I., PhD Thesis, Yale University (1992).Google Scholar
[3]Field, D.P., Ultramicroscopy 67 (1997), p. 1.10.1016/S0304-3991(96)00104-0CrossRefGoogle Scholar
[4]The authors acknowledge the Fulbright commission.Google Scholar