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Applications of a Cs Corrected HRTEM in Materials Science

Published online by Cambridge University Press:  01 November 2002

J.L. Hutchison ,
J.M. Titchmarsh ,
D.J.H. Cockayne ,
G. Möbus ,
C.J. Hetherington ,
R.C. Doole ,
F. Hosokawa ,
P. Hartel  and
M. Haider
J.L. Hutchison
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
J.M. Titchmarsh
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
D.J.H. Cockayne
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
G. Möbus
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
C.J. Hetherington
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
R.C. Doole
Affiliation:
Department of Materials, Oxford University, Parks Road, Oxford, OX1 3PH, UK
F. Hosokawa
Affiliation:
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan
P. Hartel
Affiliation:
JEOL Ltd., 1-2 Musashino 3-chome, Akishima, Tokyo 196, Japan
M. Haider
Affiliation:
CEOS GmbH, Engelstr. 28, D-69126 Heidelberg, Germany

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 10 - 11
Copyright
Copyright © Microscopy Society of America 2002