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Atom Probe Tomography Investigations of Ag Nanoparticles Embedded in Pulse-Electrodeposited Ni Films

Published online by Cambridge University Press:  29 June 2021

Hosun Jun ,
Kyuseon Jang ,
Chanwon Jung  and
Pyuck-Pa Choi
Hosun Jun
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon34141, Republic of Korea
Kyuseon Jang
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon34141, Republic of Korea
Chanwon Jung
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon34141, Republic of Korea
Pyuck-Pa Choi*
Affiliation:
Department of Materials Science and Engineering, Korea Advanced Institute of Science and Technology (KAIST), 291 Daehak-ro, Yuseong-gu, Daejeon34141, Republic of Korea
*
*Corresponding author: Pyuck-Pa Choi, E-mail: p.choi@kaist.ac.kr
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Abstract

Atomic mapping of nanomaterials, in particular nanoparticles, using atom probe tomography (APT) is of great interest, as their properties strongly depend on shape, size, and composition. However, APT analyses of nanoparticles are extremely challenging, and there is an urgent need for developing robust and universally applicable sample preparation methods. Herein, we explored a method based on pulse electrodeposition to embed Ag nanoparticles in a Ni matrix and prepare APT specimens from the resulting composite film. By systematically varying the duty cycle during pulse electrodeposition, the dispersion and number density of the nanoparticles within the matrix was significantly enhanced as compared to DC electrodeposition. Several Ag nanoparticles were analyzed with APT from such samples. Shape distortions and biased compositions were observed for the Ag nanoparticles after applying a standard data reconstruction protocol. Numerical simulations of the field evaporation process showed that such artifacts were caused by a difference in the evaporation field of Ni and Ag and a local magnification effect. We expect such detrimental effects to be mitigated by a careful selection of the matrix material, matching the evaporation field of the nanoparticles. Furthermore, we anticipate that the method presented herein can be extended to a wider range of nanomaterials.

Keywords

atom probe tomographyfield evaporation simulationlocal magnification effectmetallic nanoparticlespulse electrodeposition
Type
Materials Science Applications
Information
Microscopy and Microanalysis , Volume 27 , Issue 5 , October 2021 , pp. 1007 - 1016
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Copyright
Copyright © The Author(s), 2021. Published by Cambridge University Press on behalf of the Microscopy Society of America

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