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Atom Probe Tomography Using a Wavelength-Tunable Femtosecond-Pulsed Coherent Extreme Ultraviolet Light Source

Published online by Cambridge University Press:  05 August 2019

Ann N. Chiaramonti ,
Luis Miaja-Avila ,
Paul T. Blanchard ,
David R. Diercks ,
Brian P. Gorman  and
Norman A. Sanford
Ann N. Chiaramonti*
Affiliation:
National Institute of Standards and Technology, Boulder, CO, USA
Luis Miaja-Avila
Affiliation:
National Institute of Standards and Technology, Boulder, CO, USA
Paul T. Blanchard
Affiliation:
National Institute of Standards and Technology, Boulder, CO, USA
David R. Diercks
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO, USA
Brian P. Gorman
Affiliation:
Metallurgical and Materials Engineering, Colorado School of Mines, Golden, CO, USA
Norman A. Sanford
Affiliation:
National Institute of Standards and Technology, Boulder, CO, USA
*
*Corresponding author: chiaramonti@nist.gov

Abstract

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Type
Recent Developments in Atom Probe Tomography
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 314 - 315
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Mancini, L. et al. , J. Phys. Chem. C 118 (2014), p. 24136.Google Scholar
[2]Diercks, D.R. et al. , J. Appl. Phys. 114 (2013), p. 184903.Google Scholar
[3]Yeh, J.-J. and Landau, I., At. Data Nucl. Data Tables 32 (1985), p. 1.Google Scholar
[4]Gardner, D.F. et al. , Nature Photonics 11 (2017), p. 259.Google Scholar
[5]This project was made possible with material support from CAMECA Instruments through a Cooperative Research and Development Agreement. Commercial equipment is identified in this paper in order to specify the experimental procedure adequately. Such identification is not intended to imply recommendation or endorsement by the National Institute of Standards and Technology, nor is it intended to imply that the materials or equipment identified are necessarily the best available for the purpose.Google Scholar