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Atomic Resolution Analysis of Defect Structures in Multi-layer Chalcogenide Films

Published online by Cambridge University Press:  05 August 2019

D.L. Medlin ,
R. Fischer ,
R. Gannon ,
D.M. Hamann  and
D.C. Johnson
D.L. Medlin*
Affiliation:
Sandia National Laboratories, 7011 East Avenue, MS 9161, Livermore, CA 94551 (USA).
R. Fischer
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
R. Gannon
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
D.M. Hamann
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
D.C. Johnson
Affiliation:
Dept. of Chemistry, University of Oregon, Eugene, OR 97403 (USA).
*
*Corresponding author: dlmedli@sandia.gov

Abstract

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Type
Microscopy and Spectroscopy of Nanoscale Materials for Energy Applications
Information
Microscopy and Microanalysis , Volume 25 , Supplement S2 , August 2019 , pp. 2088 - 2089
Copyright
Copyright © Microscopy Society of America 2019 

References

[1]Johnson, D.C., Current Opinion in Solid State and Materials Science 3 (1998) 159-167.Google Scholar
[2]Merrill, D.R. et al. , Chemistry of Materials 27 (2015) 4066-4072.Google Scholar
[3]Alemayehu, M.B. et al. , Angewandte Chemie-International Edition 54 (2015) 15468-15472.Google Scholar
[4]Sutherland, D.R. et al. , Journal of the American Chemical Society 141 (2019) 922-927.Google Scholar
[5]DLM acknowledges support through Sandia National Laboratories, a multimission laboratory managed and operated by National Technology and Engineering Solutions of Sandia, LLC., a wholly owned subsidiary of Honeywell International, Inc., for the U.S. DOE NNSA under contract DE-NA-0003525. DCJ, RF, RG, and DMH acknowledge support from the National Science Foundation under grant DMR-1710214 and acknowledge the use of instrumentation in the Center for Advanced Materials Characterization in Oregon (CAMCOR) at the University of Oregon.Google Scholar