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Atomic resolution studies of the (K, Na)NbO3/SrTiO3 interface using aberration corrected STEM

Published online by Cambridge University Press:  23 September 2015

Chao Li ,
Guang Yang ,
Lingyan Wang  and
Zhao Wang
Chao Li
Affiliation:
Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education& International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an, China
Guang Yang
Affiliation:
Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education& International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an, China
Lingyan Wang
Affiliation:
Electronic Materials Research Laboratory, Key Laboratory of The Ministry of Education& International Center for Dielectric Research, Xi'an Jiaotong University, Xi'an, China
Zhao Wang
Affiliation:
Frontier Institute of Science and Technology, State Key Laboratory for Mechanical Behavior of Materials, Xi'an Jiaotong University, Xi'an, China

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 21 , Supplement S3: Proceedings of Microscopy & Microanalysis 2015 , August 2015 , pp. 2089 - 2090
Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Saito, Y., et al, Nature 432 (2004) 84.Google Scholar
[2] Yu, Q., et al, Appl. Phys. Lett 104 (2014) 102902.Google Scholar
[3] Hfch, M.J., et al, Ultramicroscopy 74 (1998) 13.Google Scholar
[4] The authors acknowledge the funding from National Natural Science Foundation of China (51202180), the Fundamental Research Funds for the Central Universities in China and the 111 Project of China (B14040).Google Scholar