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Atomic Scale Characterization of Oxygen Vacancy Dynamics by In -Situ Reduction and Analytical Atomic Resolution STEM

Published online by Cambridge University Press:  01 August 2002

R.F. Klie ,
N. D. Browning  and
Y. Zhu
R.F. Klie
Affiliation:
University of Illinois at Chicago, 845 West Taylor Street, Chicago, IL 60607-7059
N. D. Browning
Affiliation:
University of Illinois at Chicago, 845 West Taylor Street, Chicago, IL 60607-7059
Y. Zhu
Affiliation:
Brookhaven National Laboratory, Dept. of Applied Science, Upton, New York 11973

Abstract

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Information
Microscopy and Microanalysis , Volume 8 , Issue S02 , August 2002 , pp. 1396 - 1397
Copyright
Copyright © Microscopy Society of America 2002