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Article contents
Authors' Response
Published online by Cambridge University Press: 01 August 2004
Extract
The main purpose of the article by A.C. Diebold and coworkers (2003) is to propose a robust method for determination of gate oxide thickness. O'Keefe objects to a statement in this paper that “Lattice images do NOT depict the projected atom columns; instead, they are interference patterns of the directly transmitted beam with diffracted beams.”
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- © 2004 Microscopy Society of America